2SK4033

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2SK4033 2006-11-20 1 TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (U-MOS III) 2SK4033 Chopper Regulator, DC/DC Converter and Motor Drive Applications z 4 V gate drive z Low drainsource ON-resistance : R DS (ON) = 0.07 Ω (typ.) z High forward transfer admittance : |Y fs | = 6.0 S (typ.) z Low leakage current : I DSS = 100 μA (max) (V DS = 60 V) z Enhancement mode : V th = 0.8~2.0 V (V DS = 10 V, I D = 1 mA) Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit Drainsource voltage V DSS 60 V Draingate voltage (R GS = 20 k) V DGR 60 V Gatesource voltage V GSS ±20 V DC (Note 1) I D 5 A Drain current Pulse (Note 1) I DP 20 A Drain power dissipation (Tc = 25°C) P D 20 W Single-pulse avalanche energy (Note 2) E AS 40.5 mJ Avalanche current I AR 5 A Repetitive avalanche energy (Note 3) E AR 2 mJ Channel temperature T ch 150 °C Storage temperature range T stg 55~150 °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Thermal Characteristics Characteristic Symbol Max Unit Thermal resistance, channel to case R th (chc) 6.25 °C / W Thermal resistance, channel to ambient R th (cha) 125 °C / W Note 1: Ensure that the channel temperature does not exceed 150°C. Note 2: V DD = 25 V, T ch = 25°C (initial), L = 2.2 mH, R G = 25 Ω, I AR = 5 A Note 3: Repetitive rating: pulse width limited by maximum channel temperature This transistor is an electrostatic-sensitive device. Handle with care. Unit: mm JEDEC JEITA TOSHIBA 2-7B1B Weight: 0.36 g (typ.)

description

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Transcript of 2SK4033

Page 1: 2SK4033

2SK4033

2006-11-20 1

TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (U-MOS III)

2SK4033

Chopper Regulator, DC/DC Converter and Motor Drive Applications

4 V gate drive Low drain−source ON-resistance : RDS (ON) = 0.07 Ω (typ.) High forward transfer admittance : |Yfs| = 6.0 S (typ.) Low leakage current : IDSS = 100 μA (max) (VDS = 60 V) Enhancement mode : Vth = 0.8~2.0 V (VDS = 10 V, ID = 1 mA)

Absolute Maximum Ratings (Ta = 25°C)

Characteristic Symbol Rating Unit

Drain−source voltage VDSS 60 V

Drain−gate voltage (RGS = 20 kΩ) VDGR 60 V

Gate−source voltage VGSS ±20 V

DC (Note 1) ID 5 A Drain current

Pulse (Note 1) IDP 20 A

Drain power dissipation (Tc = 25°C) PD 20 W

Single-pulse avalanche energy (Note 2) EAS 40.5 mJ

Avalanche current IAR 5 A

Repetitive avalanche energy (Note 3) EAR 2 mJ

Channel temperature Tch 150 °C

Storage temperature range Tstg −55~150 °C

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

Thermal Characteristics

Characteristic Symbol Max Unit

Thermal resistance, channel to case Rth (ch−c) 6.25 °C / W

Thermal resistance, channel to ambient Rth (ch−a) 125 °C / W

Note 1: Ensure that the channel temperature does not exceed 150°C.

Note 2: VDD = 25 V, Tch = 25°C (initial), L = 2.2 mH, RG = 25 Ω, IAR = 5 A

Note 3: Repetitive rating: pulse width limited by maximum channel temperature

This transistor is an electrostatic-sensitive device. Handle with care.

Unit: mm

JEDEC ⎯

JEITA ⎯

TOSHIBA 2-7B1B

Weight: 0.36 g (typ.)

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Electrical Characteristics (Ta = 25°C)

Characteristic Symbol Test Condition Min Typ. Max Unit

Gate leakage current IGSS VGS = ±16 V, VDS = 0 V — — ±10 μA

Drain cutoff current IDSS VDS = 60 V, VGS = 0 V — — 100 μA

Drain−source breakdown voltage V (BR) DSS ID = 10 mA, VGS = 0 V 60 — — V

Gate threshold voltage Vth VDS = 10 V, ID = 1 mA 1.3 — 2.5 V

VGS = 4 V, ID = 2.5 A — 0.09 0.15Drain−source ON-resistance RDS (ON)

VGS = 10 V, ID = 2.5 A — 0.07 0.10Ω

Forward transfer admittance |Yfs| VDS = 10 V, ID = 2.5 A 3.0 6.0 — S

Input capacitance Ciss — 730 —

Reverse transfer capacitance Crss — 60 —

Output capacitance Coss

VDS = 10 V, VGS = 0 V, f = 1 MHz

— 95 —

pF

Rise time tr — 10 —

Turn−on time ton — 20 —

Fall time tf — 4 —

Switching time

Turn−off time toff

— 35 —

ns

Total gate charge (gate−source plus gate−drain) Qg — 15 —

Gate−source charge Qgs — 11 —

Gate−drain (“Miller”) charge Qgd

VDD ≈ 48 V, VGS = 10 V, ID = 5 A

— 4 —

nC

Source−Drain Ratings and Characteristics (Ta = 25°C)

Characteristic Symbol Test Condition Min Typ. Max Unit

Continuous drain reverse current (Note 1) IDR — — — 5 A

Pulse drain reverse current (Note 1) IDRP — — — 20 A

Forward voltage (diode) VDSF IDR = 5 A, VGS = 0 V — — −1.7 V

Reverse recovery time trr — 34 — ns

Reverse recovery charge Qrr IDR = 5 A, VGS = 0 V, dIDR / dt = 50 A / μs

— 28 — μC

Marking

K4033

Lot No.

A line indicates lead (Pb)-free package orlead (Pb)-free finish.

Part No. (or abbreviation code)

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2006-11-20 3

ID-VDS

0

1

2

3

4

5

0 0.4 0.8 1.2 1.6 2

ドレイン・ソース間電圧 VDS   (V)

ドレ

イン

電流

 I

D 

  

(A

 ソース接地 Tc=25 パルス測定

VGS=2.8V

3

3.34

68

10

ID-VDS

0

2

4

6

8

10

0 2 4 6 8 10

ドレイン・ソース間電圧 VDS   (V)

ドレ

イン

電流

 I

D 

  

(A

 ソース接地 Tc=25 パルス測定

VGS=2.8V

3

3.3

4

68

10

ID-VGS

0

2

4

6

8

10

0 1 2 3 4 5

ゲート・ソース間電圧 VGS  (V)

ドレ

イン

電流

 I

D 

  

(A)

 ソース接地

 VDS=10V

 パルス測定

Tc=-55

25

100

0.1

1

10

100

0.1 1 10 100

RDS(on)-ID

0

0.1

0.2

0.3

0.4

0.5

0 2 4 6 8 10

ドレイン電流 ID   (A)

ドレ

イン

・ソー

ス間

オン

抵抗

 R

DS(o

n) 

  

(m

Ω)

 ソース接地 Tc=25 パルス測定

VGS=10V

4V

VDS-VGS

0

0.4

0.8

1.2

1.6

2

0 4 8 12 16 20

ゲート・ソース間電圧 VGS   (V)

ドレ

イン

・ソ

ース

間電

圧 

VD

S 

  

(V

 ソース接地 Tc=25 パルス測定

ID=1.2A

2.5

5

ドレ

イン

・ソ

ース

間オ

ン抵

RD

S (O

N)

(m

Ω)

⎪Yfs⎪ – ID

順方向伝

達アド

ミタンス

⎪Y

fs⎪

(S

)

ドレイン電流 ID (A)

Tc = −55°C

25

100

Drain-source voltage VDS (V)

D

rain

cur

rent

I

D

(A)

Fo

rwar

d tra

nsfe

r adm

ittan

ce

⎪Yfs

⎪ (

S)

Drain-source voltage VDS (V)

D

rain

cur

rent

I

D

(A)

Gate-source voltage VGS (V)

D

rain

cur

rent

I D

(A

)

Gate-source voltage VGS (V)

Drain current ID (A) Drain current ID (A)

D

rain

-sou

rce

ON

resi

stan

ce

RD

S (O

N)

)

Dra

in-s

ourc

e vo

ltage

V

DS

(V

)

Common sourceTc = 25°C Pulse test

Common sourceTc = 25°C Pulse test

Common sourceTc = 25°C Pulse test

Common source VDS = 10 V Pulse test

Common source VDS = 10 V Pulse test

Common sourceTa = 25°C Pulse test

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RDS(on)-Tc

0

0.05

0.1

0.15

0.2

-80 -40 0 40 80 120 160

ケース温度 Tc  ()

ドレ

イン

・ソ

ース

間オ

ン抵

抗 

RD

S(o

n) 

 (Ω

)

VGS=4V

VGS=10V

ID=5A

2.5

2.5

1.2

1.25

 ソース接地 パルス測定

静電容量-VDS

10

100

1000

10000

0.1 1 10 100

ドレイン・ソース間電圧 VDS  (V)

静電

容量

 C

  

(pF

) Ciss

Coss

Crss

 ソース接地 VGS=0V f=1MHz Tc=25

Vth-Tc

1

1.2

1.4

1.6

1.8

2

2.2

2.4

2.6

-80 -40 0 40 80 120 160

ケース温度 Tc  ()

ゲー

トし

きい

値電

圧 

 V

th 

 (V

)

 ソース接地

 VDS=10V

 ID=1mA

 パルス測定

0

5

10

15

20

25

ゲー

ト・ソ

ース

間電

圧 

VG

S 

 (V

ダイナミック入出力特性

0

10

20

30

40

50

0 5 10 15 20 25 30

ゲート入力電化量 Qg  (nC)

ドレ

イン

・ソ

ース

間電

圧 

VD

S 

 (V

 ソース接地

 ID=5A

 Tc=25 パルス測定

VGS

VDD=48V

VDS

24V

12V

IDR-VDS

0.1

1

10

ドレイン・ソース間電圧 VDS  (V)

ドレ

イン

逆電

流 

ID

R 

  

(A

0 -0.2 -0.4 -0.6 -0.8 -1.0 -1.2

 ソース接地 Tc=25 パルス測定

VGS=0V

1

3

5

10

VGS = 0 V

G

ate

thre

shol

d vo

ltage

V t

h (

V)

Case temperature Tc (°C)

Total gate charge Qg (nC)

C

apac

itanc

e C

(p

F)

Capacitance – VDS

Drain-source voltage VDS (V)

Dra

in-s

ourc

e O

N re

sist

ance

R

DS

(ON

) (

Ω)

Ambient temperature Ta (°C)

D

rain

reve

rse

curre

nt

I DR

(A

)

Drain-source voltage VDS (V)

Dynamic input / output characteristics

Case temperature Tc (°C)

D

rain

pow

er d

issi

patio

n

P D

(W)

Gat

e-so

urce

vol

tage

V G

S (

V)

Common sourceID = 5 A Tc = 25°C Pulse test

Common source Pulse test

Common source VGS = 0 V f = 1 MHz Tc = 25°C

Common sourceVDS = 10 V ID = 1 mA Pulse test

Common sourceTc = 25°C Pulse test

Dra

in-s

ourc

e vo

ltage

V

DS

(V

)

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安全動作領域

0.01

0.1

1

10

100

0.1 1 10 100ドレイン・ソース間電圧  VDS  (V)

ドレ

イン

電流

  

ID

  

(A

*:単発パルス Tc=25安全動作領域は温度によって

ディレーティングして考える必

要があります。

ID max(パルス)*

ID max(連続)

直流動作Tc=25

VD

SS 

max

100μs*1ms*

rth − tw

0.01 10 μ 100 μ 1 m 10 m 100 m 1 10

0.1

1

10

0.01 0.02

0.05

0.1

0.2

Duty = 0.5

Single pulse

T

PDM

t

Duty = t/T Rth (ch-c) = 6.25°C/W

EAS – Tch

025

10

30

50

40

50 75 100 125 150

20

Channel temperature (initial) Tch (°C)

Av

alan

che

ener

gy

EA

S (

mJ)

Pulse width tw (s)

Nor

mal

ized

tran

sien

t the

rmal

impe

danc

e r th

(t)/R

th (c

h-c)

SAFE OPERATING AREA

Drain-source voltage VDS (V)

D

rain

cur

rent

I D

(A

)

* Single pulse

Tc = 25°C

Curves must be derated linearly with increase in temperature.

IDmax (continuous)

ID max (pulse)*

DC OPERATION

TC =25°C

RG = 25 Ω VDD = 25 V, L = 2.2 mH ⎟

⎟⎠

⎞⎜⎜⎝

−⋅⋅⋅=

VDDBVDSSBVDSS2IL

21

ΕAS

Test circuit Waveform

IAR

BVDSS

VDD VDS

0 V

15 V

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RESTRICTIONS ON PRODUCT USE 20070701-EN

• The information contained herein is subject to change without notice.

• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc.

• The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk.

• The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations.

• The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties.

• Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.