October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild...

8
October 2008 ©2008 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50 500V N-Channel MOSFET UniFET TM FDH50N50_F133 / FDA50N50 500V N-Channel MOSFET Features 48A, 500V, R DS(on) = 0.105Ω @V GS = 10 V Low gate charge ( typical 105 nC) Low C rss ( typical 45 pF) Fast switching 100% avalanche tested Improved dv/dt capability Description These N-Channel enhancement mode power field effect transis- tors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to mini- mize on-state resistance, provide superior switching perfor- mance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high effi- cient switched mode power supplies and active power factor correction. S D G G S D TO-247 FDH Series G S D TO-3PN FDA Series Absolute Maximum Ratings Symbol Parameter FDH50N50_F133/FDA50N50 Unit V DSS Drain-Source Voltage 500 V I D Drain Current - Continuous (T C = 25°C) - Continuous (T C = 100°C) 48 30.8 A A I DM Drain Current - Pulsed (Note 1) 192 A V GSS Gate-Source voltage ±20 V E AS Single Pulsed Avalanche Energy (Note 2) 1868 mJ I AR Avalanche Current (Note 1) 48 A E AR Repetitive Avalanche Energy (Note 1) 62.5 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns P D Power Dissipation (T C = 25°C) - Derate above 25°C 625 5 W W/°C T J, T STG Operating and Storage Temperature Range -55 to +150 °C T L Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for 5 Seconds 300 °C Thermal Characteristics Symbol Parameter Min. Max. Unit R θJC Thermal Resistance, Junction-to-Case -- 0.2 °C/W R θCS Thermal Resistance, Case-to-Sink 0.24 -- °C/W R θJA Thermal Resistance, Junction-to-Ambient -- 40 °C/W

Transcript of October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild...

Page 1: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

October 2008

©20FD

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

TM

UniFETFDH50N50_F133 / FDA50N50 500V N-Channel MOSFET

Features• 48A, 500V, RDS(on) = 0.105Ω @VGS = 10 V• Low gate charge ( typical 105 nC)• Low Crss ( typical 45 pF)• Fast switching• 100% avalanche tested• Improved dv/dt capability

DescriptionThese N-Channel enhancement mode power field effect transis-tors are produced using Fairchild’s proprietary, planar stripe, DMOS technology.

This advanced technology has been especially tailored to mini-mize on-state resistance, provide superior switching perfor-mance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high effi-cient switched mode power supplies and active power factor correction.

S

D

G

GSD

TO-247FDH Series G SD

TO-3PNFDA Series

Absolute Maximum RatingsSymbol Parameter FDH50N50_F133/FDA50N50 Unit

VDSS Drain-Source Voltage 500 V

ID Drain Current - Continuous (TC = 25°C)- Continuous (TC = 100°C)

4830.8

AA

IDM Drain Current - Pulsed (Note 1) 192 A

VGSS Gate-Source voltage ±20 V

EAS Single Pulsed Avalanche Energy (Note 2) 1868 mJ

IAR Avalanche Current (Note 1) 48 A

EAR Repetitive Avalanche Energy (Note 1) 62.5 mJ

dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns

PD Power Dissipation (TC = 25°C)- Derate above 25°C

6255

WW/°C

TJ, TSTG Operating and Storage Temperature Range -55 to +150 °C

TL Maximum Lead Temperature for Soldering Purpose,1/8” from Case for 5 Seconds 300 °C

Thermal CharacteristicsSymbol Parameter Min. Max. Unit

RθJC Thermal Resistance, Junction-to-Case -- 0.2 °C/W

RθCS Thermal Resistance, Case-to-Sink 0.24 -- °C/W

RθJA Thermal Resistance, Junction-to-Ambient -- 40 °C/W

08 Fairchild Semiconductor Corporation 1 www.fairchildsemi.comH50N50_F133 / FDA50N50 Rev. A

Page 2: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

FD

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

Package Marking and Ordering InformationDevice Marking Device Package Reel Size Tape Width Quantity

FDH50N50_F133 FDH50N50_F133 TO-247 - - 30

FDA50N50 FDA50N50 TO-3PN - - 30

Electrical Characteristics TC = 25°C unless otherwise noted

Symbol Parameter Conditions Min. Typ. Max UnitsOff Characteristics

BVDSS Drain-Source Breakdown Voltage VGS = 0V, ID = 250μA 500 -- -- V

ΔBVDSS/ ΔTJ

Breakdown Voltage Temperature Coefficient ID = 250μA, Referenced to 25°C -- 0.5 -- V/°C

IDSS Zero Gate Voltage Drain Current VDS = 500V, VGS = 0VVDS = 400V, TC = 125°C

----

----

25250

μAμA

IGSSF Gate-Body Leakage Current, Forward VGS = 20V, VDS = 0V -- -- 100 nA

IGSSR Gate-Body Leakage Current, Reverse VGS = -20V, VDS = 0V -- -- -100 nA

On Characteristics

VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250μA 3.0 -- 5.0 V

RDS(on) Static Drain-SourceOn-Resistance VGS = 10V, ID = 24A -- 0.089 0.105 Ω

gFS Forward Transconductance VDS = 40V, ID = 48A (Note 4) -- 20 -- S

Dynamic Characteristics

Ciss Input Capacitance VDS = 25V, VGS = 0V,f = 1.0MHz

-- 4979 6460 pF

Coss Output Capacitance -- 760 1000 pF

Crss Reverse Transfer Capacitance -- 50 65 pF

Coss Output Capacitance VDS = 400V, VGS = 0V, f = 1.0MHz -- 161 -- pF

Coss eff. Effective Output Capacitance VDS = 0V to 400V, VGS = 0V -- 342 -- pF

Switching Characteristics

td(on) Turn-On Delay Time VDD = 250V, ID = 48ARG = 25Ω

(Note 4, 5)

-- 105 220 ns

tr Turn-On Rise Time -- 360 730 ns

td(off) Turn-Off Delay Time -- 225 460 ns

tf Turn-Off Fall Time -- 230 470 ns

Qg Total Gate Charge VDS = 400V, ID = 48AVGS = 10V

(Note 4, 5)

-- 105 137 nC

Qgs Gate-Source Charge -- 33 -- nC

Qgd Gate-Drain Charge -- 45 -- nC

Drain-Source Diode Characteristics and Maximum Ratings

IS Maximum Continuous Drain-Source Diode Forward Current -- -- 48 A

ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 192 A

VSD Drain-Source Diode Forward Voltage VGS = 0V, IS = 48A -- -- 1.4 V

trr Reverse Recovery Time VGS = 0V, IS = 48AdIF/dt =100A/μs (Note 4)

-- 580 -- ns

Qrr Reverse Recovery Charge -- 10 -- μC

NOTES:1. Repetitive Rating: Pulse width limited by maximum junction temperature2. L = 1.46mH, IAS = 48A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C

3. ISD ≤ 48A, di/dt ≤ 200A/μs, VDD ≤ BVDSS, Starting TJ = 25°C

4. Pulse Test: Pulse width ≤ 300μs, Duty Cycle ≤ 2%

5. Essentially Independent of Operating Temperature Typical Characteristics

2 www.fairchildsemi.comH50N50_F133 / FDA50N50 Rev. A

Page 3: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

FD

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

Typical Performance Characteristics

Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics

10-1 100 10110-1

100

101

102 VGS

Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 VBottom : 5.5 V

Notes : 1. 250μs Pulse Test 2. TC = 25oC�

I D, D

rain

Cur

rent

[A]

VDS, Drain-Source Voltage [V]4 5 6 7 8 9 10

0.1

1

10

100

Notes : 1. VDS = 40V 2. 250μs Pulse Test

-55o C�

150o C�

25o C�

I D ,

Dra

in C

urre

nt [

A]

VGS , Gate-Source Voltage [V]

Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward VoltageDrain Current and Gate Voltage Variation vs. Source Current

and Temperatue

0 25 50 75 100 125 150 1750.0

0.1

0.2

0.3

0.4

VGS = 20V

VGS = 10V

Note : TJ = 25oC

RD

S(O

N) [Ω

],D

rain

-Sou

rce

On-

Res

ista

nce

ID, Drain Current [A]0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6

0

40

80

120

160

25oC

150oC

Notes : 1. VGS = 0V 2. 250μs Pulse Test

I DR ,

Rev

erse

Dra

in C

urre

nt [

A]

VSD , Source-Drain Voltage [V]

Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics

10-1 100 101 1020

2,000

4,000

6,000

8,000

10,000

12,000Ciss = Cgs + Cgd (Cds = shorted)Coss = Cds + Cgd

Crss = Cgd

Notes : 1. VGS = 0 V 2. f = 1 MHz

Crss

Coss

Ciss

Cap

acita

nce

[pF]

VDS, Drain-Source Voltage [V]0 20 40 60 80 100 120

0

2

4

6

8

10

12

VDS = 250V

VDS = 100V

VDS = 400V

Note : ID = 48A

VG

S, G

ate-

Sou

rce

Vol

tage

[V]

QG, Total Gate Charge [nC]

3 www.fairchildsemi.comH50N50_F133 / FDA50N50 Rev. A

Page 4: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

FD

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

Typical Performance Characteristics (Continued)

Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variationvs. Temperature vs. Temperature

-100 -50 0 50 100 150 2000.8

0.9

1.0

1.1

1.2

Notes : 1. V

GS = 0 V

2. ID = 250 μA

BV

DS

S, (

Nor

mal

ized

)D

rain

-Sou

rce

Bre

akdo

wn

Vol

tage

TJ, Junction Temperature [oC]-100 -50 0 50 100 150 200

0.0

0.5

1.0

1.5

2.0

2.5

Notes : 1. VGS = 10 V 2. ID = 24 A

RD

S(O

N),

(Nor

mal

ized

)D

rain

-Sou

rce

On-

Res

ista

nce

TJ, Junction Temperature [oC]

Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Currentvs. Case Temperature

100 101 102 10310-1

100

101

102

103

10 us

DC10 ms

1 ms100 us

Operation in This Area is Limited by R DS(on)

Notes : 1. TC = 25 oC

2. TJ = 150 oC 3. Single Pulse

I D, D

rain

Cur

rent

[A]

VDS, Drain-Source Voltage [V]

25 50 75 100 125 1500

10

20

30

40

50

I D, D

rain

Cur

rent

[A]

TC, Case Temperature [oC]

Figure 11. Typical Drain Current Slope Figure 12. Typical Drain-Source Voltagevs. Gate Resistance Slope vs. Gate Resistance

0 5 10 15 20 25 30 35 40 45 500

5

10

15

20

25

30

35

40

45 Notes : 1. VDS = 400 V 2. VGS = 12 V 3. ID = 25A

4. TJ = 125oC�

dv/dt(off)

dv/dt(on)

dv/d

t [V

/nS

]

RG, Gate resistance [Ω]0 5 10 15 20 25 30 35 40 45 50

0

500

1,000

1,500

2,000

2,500

3,000

3,500

4,000 Notes : 1. VDS = 400 V 2. VGS = 12 V 3. ID = 25A

4. TJ = 125oC

di/dt(off)

di/dt(on)

di/d

t [A

/μS

]

RG, Gate resistance [Ω]

4 www.fairchildsemi.comH50N50_F133 / FDA50N50 Rev. A

Page 5: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

FD

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

Typical Performance Characteristics (Continued)

Figure 13. Typical Switching Losses vs. Figure 14. Unclamped Inductive Switching Gate Resistance Capability

0 5 10 15 20 25 30 35 40 45 500

200

400

600

800

1,000

Notes : 1. VDS = 400 V 2. VGS = 12 V 3. I

D = 25A

4. TJ = 125oC�

Eoff

Eon

Ene

rgy

[μJ]

RG, Gate resistance [Ω]0.01 0.1 1 10 1001

10

100

Starting TJ = 150oC

Notes : 1. If R = 0 Ω tAV = (L)(IAS)/(1.3 Rated BVDSS - VDD) 2. If R ≠ 0 Ω tAV = (L/R)In[(IAS x R)/(1.3 Rated BVDSS - VDD)+1]

Starting TJ = 25oC

I AS, A

vala

nche

Cur

rent

[A]

tAV, Time In Avalanche [ms]

Figure 15. Transient Thermal Resistance Curve

10-5 10-4 10-3 10-2 10-1 100 10110-3

10-2

10-1

Notes : 1. Z

θJC(t) = 0.2 oC/W Max. 2. Duty Factor, D=t1/t2

3. TJM - TC = PDM * ZθJC(t)

single pulse

D=0.5

0.02

0.2

0.05

0.1

0.01

Z θJC(t)

, The

rmal

Res

pons

e

t1, Square Wave Pulse Duration [sec]

5 www.fairchildsemi.comH50N50_F133 / FDA50N50 Rev. A

Page 6: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

FD

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

Mechanical Dimensions

TO-247AB

Dimensions in Millimeters

6 www.fairchildsemi.comH50N50_F133 / FDA50N50 Rev. A

Page 7: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

FD

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

Mechanical Dimensions

Dimensions in Millimeters

TO-3PN

7 www.fairchildsemi.comH50N50_F133 / FDA50N50 Rev. A

Page 8: October 2008 UniFETTM FDH50N50 F133 / FDA50N50 Sheets/Fairchild PDFs...October 2008 ©2008 Fairchild Semiconductor Corporation 1 FDH50N50_F133 / FDA50N50 Rev. A FDH50N50_F133 / FDA50N50

8 www.fairchildsemi.comFDH50N50_F133 / FDA50N50 Rev. A

FDH

50N50_F133 / FD

A50N

50 500V N-C

hannel MO

SFET

Rev. I37

TRADEMARKSThe following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.

* EZSWITCH™ and FlashWriter® are trademarks of System General Corporation, used under license by Fairchild Semiconductor.

DISCLAIMERFAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.

LIFE SUPPORT POLICYFAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.

As used herein:1. Life support devices or systems are devices or systems which, (a) are

intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.

2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.

PRODUCT STATUS DEFINITIONSDefinition of Terms

Build it Now™CorePLUS™CorePOWER™CROSSVOLT™CTL™Current Transfer Logic™EcoSPARK®

EfficentMax™EZSWITCH™ * ™

Fairchild®

Fairchild Semiconductor®FACT Quiet Series™FACT®

FAST®

FastvCore™FlashWriter® *FPS™F-PFS™

FRFET®

Global Power ResourceSM

Green FPS™Green FPS™ e-Series™GTO™IntelliMAX™ISOPLANAR™MegaBuck™MICROCOUPLER™MicroFET™MicroPak™MillerDrive™MotionMax™Motion-SPM™OPTOLOGIC®

OPTOPLANAR®®

PDP SPM™Power-SPM™PowerTrench®

PowerXS™

Programmable Active Droop™QFET®

QS™Quiet Series™RapidConfigure™

™Saving our world, 1mW /W /kW at a time™SmartMax™SMART START™SPM®

STEALTH™SuperFET™SuperSOT™-3SuperSOT™-6SuperSOT™-8SupreMOS™SyncFET™

®

The Power Franchise®

TinyBoost™TinyBuck™TinyLogic®

TINYOPTO™TinyPower™TinyPWM™TinyWire™μSerDes™

UHC®

Ultra FRFET™UniFET™VCX™VisualMax™XS™

tm

®

tm

tm

Datasheet Identification Product Status Definition

Advance Information Formative / In Design Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.

Preliminary First ProductionDatasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.

No Identification Needed Full Production Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.

Obsolete Not In Production Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.

ANTI-COUNTERFEITING POLICYFairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Farichild’s Anti-Counterfeiting Policy is also stated on our external website, www.fairchildsemi.com, under Sales Support.

Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Farichild strongly encourages customers to purchase Farichild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Farichild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Farichild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.