4:45 (244) Achieving Custom Manipulation of Sample Data Using Dynamic Data Ex­change in Atomic Spectroscopy. F. Délies, Ε. Vanclay

Instrumentation II—Advances in FT-IR, Raman, Sensors, and Optical Methods Room 84 G. J. Meisner, Presiding 1:30 (245) Sensitivity Issues in Step-Scan

FT-IR Spectrometry. C. Manning 1:50 (246) Synchrotron Radiation-Powered IR

Microspectroscopy Used To Chemically Map Tissue Sections Operating in Trans­mission Mode. D. L. Wetzel, A. J. Ei-lert, J. A. Reffner, L. Carr, S. M. LeVine, S. S. Miller, L. Pietrzak

2:10 (247) Comparative Study of Fiber-Optic Remote Raman Probe Designs. T. F. Cooney, Η. Τ. Skinner, S. M. Angel

2:30 (248) Tunable External-Cavity Diode La­sers for Raman Spectroscopy. T. F. Cooney, S. M. Angel

2:50 (249) Designing a UV-vis System To Meet the Qualification Requirements of the Regulatory Environment. J. P. Ham­mond, M. Long, P. Davies, M. Brown

3:25 (250) Integrated Optical Analytical Sensor Based on Antiresonance Waveguides. T. Delonge, H. Fouckhardt

3:45 (251) Radionuclide Scintillator Light Source for Time-Resolved Fluorometry. D. L. Burden, S. E. Hobbs, G. M. Hieftje

4:05 (252) Multidimensional Hadamard Trans­form Spectrometry. M. K. Bellamy, A. N. Mortensen, E. A. Orr, D. A. Mc­Carthy, J. V. Paukstelis, R. M. Ham-maker, W. G. Fateley

4:25 (253) Multiple-Wavelength Laser Light Scattering for Polymer Analysis. C. E. Mooney

4:45 (254) Tests for the Survivability of a Thin Film Microelectronic Gas Sensor Struc­ture for Automotive Applications. S. V. Patel, J. W. Schwank, D. A. Schweiss, J. L Gland, K. D. Wise

Tuesday Morning Symposium: Direct Solids Elemental Analysis—What Technique Do You Use? (Arranged by R. K. Marcus) Room 80 R. K. Marcus, Presiding 8:30 Introductory Remarks. R. K. Marcus 8:35 (360) Direct Spark Spectrometries and

Spark Ablation ICP Spectrometries. J.A.C. Broekaert

9:10 (361) Present and Future Trends in the XRF Analysis of Solid Materials. P. Pella

9:45 (362) Direct Analysis of Solids by Second­ary Ion MS. C. W. Magee

10:35 (363) Glow Discharge Devices for Bulk and Depth-Resolved Analyses. R. K. Marcus

11:10 (364) Laser Ablation into ICP-AES and MS: Bulk and Small Feature Analysis. A. Raith

Symposium: Near-Field Imaging and Spectroscopy—The Chemical Perspective (Arranged by P. J. Treado) Room 82 P. J. Treado, Presiding 8:30 Introductory Remarks. P. J. Treado 8:35 (365) When Lenses Fail. A. Lewis

9:10

9:45

(366) Near-Field Fluorescence Micros­copy and Spectroscopy of Single Mole­cules. S. Xie, R. Dunn (367) Combined Imaging/Sensing Using Polymer-Modified Imaging Fibers. D. R. Walt

10:35 (368) Spectroscopy of Single-Nanometer-Dimension Objects: From Molecules to Quantum Electronic Devices. T. D. Har­ris, J. K. Trautman, J. Macklin, R. D. Grober, H. Hess

11:10 (369) Progress on Applications in Near-Field Scanning Optical Microscopy. P. Moyer

Applications in Raman Spectroscopy Room 83 C. McCreary, Presiding 8:30 (380) Design, Performance, and Applica­

tions of a Compact Raman Spectrome­ter. H.F.J. Cormican, M. G. Catney, J. J. McGarvey

8:50 (381 ) Characterization of Paint Films by Raman Spectroscopy. C. K. Mann, B. Sun, T. J. Vickers

9:10 (382) Process Control in Petroleum Indus­try by Raman Spectroscopy. N. Zanier, P. Marteau, F. Cansell, A. Aoufi, G. Ho-tier, D. Silva

9:30 (383) Nondestructive Evaluation of Me­chanical Properties in Fiber-Reinforced Composites by FT-Raman Spectroscopy. S. Farquharson, R. Basilakis, M. Car-angelo, M. DiTaranto, W. Smith, M. A. Se-rio, P. R. Solomon, C. Petty, R. Elleithy, T. Ebeling, J. F. Wallace

9:50 (384) In situ Analysis of TLC Frac­tions—A New, Simple Method for Sur­face-Enhanced Raman Spectroscopy. J. J. Andrew, B. P. Newby, C. J. Adams

10:25 (385) UV Resonance Raman Microscopy. V. Pajcini, R. W. Bormett, S. A. Asher

10:45 (386) UV-Raman Spectroscopy Monitors the First-, Second-, and Third-Order Phonon Bands of Diamond and the C-H Stretching Bands of Nondiamond Compo­nents of CVD Diamond Films. R. W. Bormett, S. A. Asher, R. E. Witkowski, W. D. Partlow

11:05 (387) Ultrasensitive Detection of Pyrene by UV Resonance Raman Spectrometer Using an Intracavity Frequency-Doubled CW Argon Ion Laser. Z. Chi, S. A. Asher

FT-IR—Process and Interfacial Applications Room 87 J. A. de Haseth, Presiding 8:30 (408) FT-IR Process Monitoring for Opti­

mization of ΝΟΛ Control at Coal-Fired Power Plants. A. S. Bonanno, C. M. Nel­son, K. S. Knight, M. A. Serio, P. R. So­lomon

8:50 (409) Real-Time Monitoring of Metal Pow­der Size and Temperature by FT-IR Spectroscopy for Intelligent Process Con­trol. S. Farquharson, P. Rosenthal, J. Cosgrove, J. Haigis, J. R. Markham, P. R. Solomon, S. Ridder, F. Biancaniello

9:10 (410) A Novel Approach to Open-Path FT-IR Spectroscopy. R. L. Richardson, P. R. Griffiths

9:30 (411) Diels-Alder Reaction Analyses Us­ing a Mid-IR Fiber-Optic Probe. J. A. Van Gompel

9:50 (412) Anomalous Bandshapes in Surface-Enhanced IR Absorption Spectroscopy on Metal Films. G. T. Merklin, P. R. Grif­fiths

10:25 (413) Micro-Raman Imaging of an Epoxy at an Interfacial Region. C. M. Stell-man, M. L. Myrick

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