Preliminary Datasheet RJH60M3DPQ-E0 · RJH60M3DPQ-E0 Preliminary R07DS1086EJ0200 Rev.2.00 Page 3 of...
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R07DS1086EJ0200 Rev.2.00 Page 1 of 9 Jun 13, 2013
Preliminary Datasheet
RJH60M3DPQ-E0 600V - 17A - IGBT Application: Inverter
Features
• Short circuit withstand time (8 μs typ.) • Low collector to emitter saturation voltage
VCE(sat) = 1.8 V typ. (at IC = 17 A, VGE = 15 V, Ta = 25°C) • Built in fast recovery diode (100 ns typ.) in one package • Trench gate and thin wafer technology • High speed switching
tf = 70 ns typ. (at VCC = 300 V, VGE = 15 V, IC = 17 A, Rg = 5 Ω, Ta = 25°C)
Outline
1. Gate
2. Collector
3. Emitter
4. Collector
C
G
E1 2
3
4
RENESAS Package code: PRSS0003ZE-A
(Package name: TO-247)
Absolute Maximum Ratings
(Ta = 25°C)
Item Symbol Ratings Unit
Collector to emitter voltage / diode reverse voltage VCES / VR 600 V
Gate to emitter voltage VGES ±30 V
Collector current Tc = 25°C IC 35 A
Tc = 100°C IC 17 A
Collector peak current IC(peak) Note1 50 A
Collector to emitter diode forward current IDF 17 A
Collector to emitter diode forward peak current IDF(peak) Note1 50 A
Collector dissipation PCNote2 127 W
Junction to case thermal resistance (IGBT) θj-c Note2 1.25 °C/ W
Junction to case thermal resistance (Diode) θj-cd Note2 2.3 °C/ W
Junction temperature Tj 150 °C
Storage temperature Tstg –55 to +150 °C
Notes: 1. PW ≤ 10 μs, duty cycle ≤ 1%
2. Value at Tc = 25°C
R07DS1086EJ0200Rev.2.00
Jun 13, 2013
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 2 of 9 Jun 13, 2013
Electrical Characteristics
(Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Zero gate voltage collector current / Diode reverse current
ICES / IR — — 5 μA VCE = 600 V, VGE = 0
Gate to emitter leak current IGES — — ±1 μA VGE = ±30 V, VCE = 0
Gate to emitter cutoff voltage VGE(off) 5 — 7 V VCE = 10 V, IC = 1 mA
Collector to emitter saturation voltage VCE(sat) — 1.8 2.3 V IC = 17 A, VGE = 15 V Note3
VCE(sat) — 2.4 — V IC = 35 A, VGE = 15 V Note3
Input capacitance Cies — 900 — pF VCE = 25 V VGE = 0 f = 1 MHz
Output capacitance Coes — 65 — pF
Reverse transfer capacitance Cres — 35 — pF
Total gate charge Qg — 60 — nC VGE = 15 V VCE = 300 V IC = 17 A
Gate to emitter charge Qge — 9 — nC
Gate to collector charge Qgc — 35 — nC
Turn-on delay time td(on) — 40 — ns VCC = 300 V VGE = 15 V IC = 17 A Rg = 5 Ω Inductive load
Rise time tr — 20 — ns
Turn-off delay time td(off) — 90 — ns
Fall time tf — 80 — ns
Turn-on energy Eon — 0.29 — mJ
Turn-off energy Eoff — 0.29 — mJ Total switching energy Etotal — 0.58 — mJ Short circuit withstand time tsc 6 8 — μs Tc = 100 °C
VCC ≤ 360 V, VGE = 15 V
FRD Forward voltage VF — 1.3 1.7 V IF = 17 A Note3
FRD reverse recovery time trr — 100 — ns IF = 17 A diF/dt = 100 A/μs FRD reverse recovery charge Qrr — 0.14 — μC
FRD peak reverse recovery current Irr — 4.1 — A
Notes: 3. Pulse test.
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 3 of 9 Jun 13, 2013
Main Characteristics
40
50
30
20
10
0
Typical Output Characteristics
40
50
30
20
10
1 2 3 4 5
Co
llector C
urrent I C
(A)
00
Collector to Emitter Voltage VCE (V)
Pulse Test
Tc = 25°C
VGE = 8 V
13 V
15 V
14 V
10 V
12 V
Typical Output Characteristics
1 2 3 4 5
Co
llector C
urrent I C
(A)
0
Collector to Emitter Voltage VCE (V)
Pulse Test
Tc = 150°C
VGE = 8 V
14 V
10 V
12 V
13 V
Co
llector C
urrent I C
(A)
Case Temperature Tc (°C)
Maximum DC Collector Current vs. Case Temperature
0 25 50 10075 125 150 1750 25 50 10075 125 150 175
Co
llector C
urrent I C
(A)
Collector to Emitter Voltage VCE (V)
Turn-off SOA
0 200 400 600 800
Co
llector
Dis
sipation
Pc (W)
Case Temperature Tc (°C)
Collector Dissipation vs. Case Temperature
160
120
80
40
0
40
30
20
10
0
0
80
60
40
20
15 V
Co
llector C
urrent I C
(A)
Collector to Emitter Voltage VCE (V)
Maximum Safe Operation Area
0.01
100
1
10
0.1
1 10010 1000
Tc = 25°C
Single pulse
100 µs
PW = 10 µs
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 4 of 9 Jun 13, 2013
10
8
6
4
2
0
50
40
30
20
10
0
Typical Transfer Characteristics
Col
lect
or C
urre
nt
I C (
A)
0 4 8 12 16
VCE = 10 VPulse Test
Gate to Emitter Voltage VGE (V)
25°C
Tc = 150°C
Collector to Emitter Saturation Voltagevs. Junction Temparature (Typical)
−25 0 25 75 12550 100 150
Col
lect
or to
Em
itter
Sat
urat
ion
Volta
ge
V
CE
(sat
) (V
)
Case Temparature Tc (°C)
17 A
3 A
IC = 35 A
0
1
2
4
3
VGE = 15 VPulse Test
Collector to Emitter Saturation Voltagevs. Gate to Emitter Voltage (Typical)
Col
lect
or to
Em
itter
Sat
urat
ion
Volta
ge
V
CE
(sat
) (V
)
Gate to Emitter Voltage VGE (V)
Collector to Emitter Saturation Voltagevs. Gate to Emitter Voltage (Typical)
Col
lect
or to
Em
itter
Sat
urat
ion
Volta
ge
V
CE
(sat
) (V
)
Gate to Emitter Voltage VGE (V)
Gate to Emitter Cutoff Voltagevs. Junction Temparature (Typical)
−25 0 25 75 12550 100 150
Gat
e to
Em
itter
Cut
off V
olta
ge
VG
E(o
ff) (
V)
VCE = 10 VPulse Test
Junction Temparature Tj (°C)
1 mA
IC = 10 mA
16
12
8
4
0
Frequency Characteristics (Typical)
Col
lect
or C
urre
nt
I C(R
MS
) (A
)
Frequency f (kHz)
1 10010 1000
0Collector current wave
(Square wave)
1
3
2
4
5
8 10 12 181614 20 8 10 12 181614 20
IC = 35 A
17 A
IC = 35 A
17 A
Tc = 25°CPulse Test
1
3
2
4
5Tc = 150°CPulse Test
Tj = 125°CTc = 90°CVCE = 400 VVGE = 15 VRg = 5 Ωduty = 50%
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 5 of 9 Jun 13, 2013
10 100
100
1000
1
10
1
td(on)
tr
tftd(off)
0.1
1
10
1 10 100
1 10 100
Gate Registance Rg (Ω)(Inductive load)
Eoff
Eon
Sw
ithin
g E
nerg
y Lo
sses
E
(m
J)
Switching Characteristics (Typical) (4)
VCC = 300 V, VGE = 15 VIC = 17 A, Tc = 150°C
0.1
1
10
Eoff
Eon
VCC = 300 V, VGE = 15 VRg = 5 Ω, Tc = 150°C
Sw
ithin
g E
nerg
y Lo
sses
E
(m
J)
Collector Current IC (A)(Inductive load)
Switching Characteristics (Typical) (2)Switching Characteristics (Typical) (1)
Collector Current IC (A)(Inductive load)
Sw
itchi
ng T
imes
t
(ns)
VCC = 300 V, VGE = 15 VRg = 5 Ω, Tc = 150°C
1 10 100
Switching Characteristics (Typical) (3)
td(on)
Gate Resistance Rg (Ω)(Inductive load)
Sw
itchi
ng T
ime
t (
ns)
10
100
1000VCC = 300 V, VGE = 15 VIC = 17 A, Tc = 150°C
tftd(off)
tr
10
100
1000
5025 15075 125100
Switching Characteristics (Typical) (5)
td(on)
Channel Temperature Tc (°C)(Inductive load)
Sw
itchi
ng T
imes
t
(ns)
VCC = 300 V, VGE = 15 VIC = 17 A, Rg = 5 Ω
tf
td(off)
tr
0.1
1
10
5025 15075 125100
Channel Temperature Tc (°C)(Inductive load)
Switching Characteristics (Typical) (6)
Eoff
Eon
Sw
ithin
g E
nerg
y Lo
sses
E
(m
J) VCC = 300 V, VGE = 15 VIC = 17 A, Rg = 5 Ω
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 6 of 9 Jun 13, 2013
0 10 3020 7040 6050
20
10
50
40
30
0
Gate Charge Qg (nC)
Diode Current Slope di/dt (A/μs)
Dynamic Input Characteristics (Typical)
800
600
400
200
0
16
12
8
4
0
VCC = 300 VIC = 17 ATc = 25°C
VGE
VCE
Col
lect
or to
Em
itter
Vol
tage
V
CE (
V)
Rev
erse
Rec
over
y Ti
me
trr (
ns)
Gat
e to
Em
itter
Vol
tage
V
GE (
V)
Cap
acita
nce
C (
pF)
Typical Capacitance vs.Collector to Emitter Voltage
Reverse Recovery Time vs.Diode Current Slope (Typical)
Collector to Emitter Voltage VCE (V)
80
40
200
160
120
00 40 80 200120 160 0 40 80 200120 160
VCC = 300 VIF = 17 A
Tc = 150°C
25°C
Diode Current Slope di/dt (A/μs)
Rev
erse
Rec
over
y C
urre
nt
I rr (
A)
Reverse Recovery Current vs.Diode Current Slope (Typical)
Diode Current Slope di/dt (A/μs)
Rev
erse
Rec
over
y C
harg
e Q
rr (μC
)
Reverse Recovery Charge vs.Diode Current Slope (Typical)
0.2
0.1
0.5
0.4
0.3
0
VCC = 300 VIF = 17 A
Tc = 150°C
25°C
8
4
16
12
00 40 80 200120 160
VCC = 300 VIF = 17 A
Tc = 150°C
25°C
25°C
C-E Diode Forward Voltage VCEF (V)
Forward Current vs. Forward Voltage (Typical)
Forw
ard
Cur
rent
I F
(A
)
0 0.4 0.8 1.2 1.6 2.0 2.4
VGE = 0 VPulse Test
Tc = 150°C
1
10
100
1000
1000
0 10050 150 200 250 300
Cies
Coes
CresVGE = 0 Vf = 1 MHzTc = 25°C
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 7 of 9 Jun 13, 2013
0.01
1
0.1
10
100 μ 1 m 10 m 100 m 1 10
PDM
PW
T
D =PW
T
θj – c(t) = γs (t) • θj – c
θj – c = 2.3°C/W, Tc = 25°C
0.2
0.1
0.5
D = 1
Tc = 25°C
100
0.020.05
1 shot pulse0.01
0.01
1
0.1
10
100 μ 1 m 10 m 100 m 1 10
PDM
PW
T
D =PW
T
θj – c(t) = γs (t) • θj – c
θj – c = 1.25°C/W, Tc = 25°C
0.2
0.1
0.5
D = 1
Tc = 25°C
100
0.020.05
1 shot pulse
Pulse Width PW (s)
No
rma
lize
d T
ran
sie
nt
Th
erm
al Im
pe
da
nce
γ
s (t
) Normalized Transient Thermal Impedance vs. Pulse Width (IGBT)
Pulse Width PW (s)
No
rma
lize
d T
ran
sie
nt
Th
erm
al Im
pe
da
nce
γ
s (t
)
Normalized Transient Thermal Impedance vs. Pulse Width (Diode)
0.01
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 8 of 9 Jun 13, 2013
Switching Time Test Circuit
Diode Reverse Recovery Time Test Circuit
Waveform
Waveform
Diode clamp
D.U.T
D.U.T
Rg
L
VCC
VCC
trr
Irr
diF/dt
0.9 Irr
IF
IF
Rg
td(off) td(on)tf tr
90%
90% 90%
10%
10%10%
VGE
IC
0.5 Irr
L
0
RJH60M3DPQ-E0 Preliminary
R07DS1086EJ0200 Rev.2.00 Page 9 of 9 Jun 13, 2013
Package Dimension
15.94 ± 0.19
5.45
6.1
5
21
.13
± 0
.33
20
.19
± 0
.38
4.5
ma
x
φ3.60 ± 0.1
2.10
1.27 ± 0.13
5.45 2.410.71 ± 0.1
5.02 ± 0.19
Unit: mm⎯ 6.0g
MASS[Typ.]
⎯PRSS0003ZE-A
RENESAS CodeJEITA Package Code Previous CodePackage Name
TO-247
17
.63
13.26
+ 0.1– 0.2
Ordering Information
Orderable Part No. Quantity Shipping Container
RJH60M3DPQ-E0#T2 450 pcs Tube
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