Cite as: J. Shim et al., Science

10.1126/science.aat8126 (2018).

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materialsControlled crack propagation for atomic precision handling of wafer-scale two-dimensional

Xuanhe Zhao, Jong-Hyun Ahn, Christopher Hinkle, Abdallah Ougazzaden and Jeehwan KimXin Li, Hanwool Yeon, Chanyeol Choi, Hyun Kum, Ruoyu Yue, Guanyu Zhou, Yunbo Ou, Kyusang Lee, Jagadeesh Moodera, Jaewoo Shim, Sang-Hoon Bae, Wei Kong, Doyoon Lee, Kuan Qiao, Daniel Nezich, Yong Ju Park, Ruike Zhao, Suresh Sundaram,

published online October 11, 2018

ARTICLE TOOLS http://science.sciencemag.org/content/early/2018/10/10/science.aat8126

MATERIALSSUPPLEMENTARY http://science.sciencemag.org/content/suppl/2018/10/10/science.aat8126.DC1

REFERENCES

http://science.sciencemag.org/content/early/2018/10/10/science.aat8126#BIBLThis article cites 34 articles, 4 of which you can access for free

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registered trademark of AAAS. is aScienceAmerican Association for the Advancement of Science. No claim to original U.S. Government Works. The title

Science, 1200 New York Avenue NW, Washington, DC 20005. 2017 © The Authors, some rights reserved; exclusive licensee (print ISSN 0036-8075; online ISSN 1095-9203) is published by the American Association for the Advancement ofScience

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