5 Jitter Separation in High Speed Digital Design FE · 2 2 2 exp σ x ... RPP DJ = J PP DJ The...
Transcript of 5 Jitter Separation in High Speed Digital Design FE · 2 2 2 exp σ x ... RPP DJ = J PP DJ The...
Jitter Separation in High Speed Digital Design
Gustaaf Sutorius
Jitter & Typical Digital Development Process
System
Design
Interconnect
Design
Active Signal
Analysis
Compliance
Test
• Accurate Design
Analysis
• Test & Analysis
CapabilityCapability
• Measurement
Automation
AGENDA 1. Jitter:
I. Definition and Description of Jitter
II. Understanding Jitter, its Components, and Separation
III. Jitter Measurement Methods and Tools
Page 3
2. Actual jitter measurements
AGENDA 1. Jitter:
I. Definition and Description of Jitter
II. Understanding Jitter, its Components, and Separation
III. Jitter Measurement Methods and Tools
Page 4
III. Jitter Measurement Methods and Tools
2. Actual jitter measurements
1. Definition and Description of Jitter
2. Understanding Jitter, its Components, and Separation
3. Jitter Measurement Methods and Tools
Jitter Primer: Topics to be Covered
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• ‘Jitter ‘ is another word for shaky, quiver,
tremulous… speaks of degree of instability of
location.
• In the Digital Design world, jitter has been defined
as:
What is Jitter?
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The short term phase variation of the significant instants of a digital signal from their ideal positions in time.
Ideal Location in Time (Reference)
ThresholdEarly
Transition
Instant
What is Jitter: Analyzing an Edge (Transition)
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ThresholdLate
∆∆∆∆tEarly
JPP=∆∆∆∆tEarly Pk + ∆∆∆∆tlate Pk∆∆∆∆tLate
0 1
1) Seconds: if ∆∆∆∆tEarly =60 ps and ∆∆∆∆tLate=40ps
JPP= 100 pseconds
2) UI: Referenced to the Data Rate, called Unit Interval (UI):
Units for expressing Jitter
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2) UI: Referenced to the Data Rate, called Unit Interval (UI):
For 2.5 Gb/s Data Rate, the UI (Period) = 400 pseconds
JPP= 100 pseconds/400 pseconds per UI = 0.25 UI
3) Radians: where there are 2ππππ radians per UI:
JPP= .25 UI x 2ππππ= ππππ/2 radians
Singletransition
x = 0
Eye CrossingPoints
x = Tx = 1/2 T
Left Edge Right EdgeNominal
Sampling Point
E1
E0
Jitter: Creating the Eye…
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The EYE Diagram Unit Interval
Overlaidtransitions
Ideal Sampling Point
x = 0 x = Tx = 1/2 T
Oscilloscope Eye
Probability DensityFunction
Total Jitter, J PP
Why Care about Jitter?
• Bit Errors!
1
TransmittedWaveform 0 0 1 0 1 1 0
Received
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1
ReceivedWaveform 0 0 1 0 1 1 0
1
InterprettedWaveform 0 1 0 1 1 01
Jitter as Horizontal “Timing Noise”
• A low “Signal to Noise Ratio”
causes errors
• Voltage Noise →→→→ vertical
fluctuations across the
sampling point
• Undesirable Amplitude
Modulation
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• Undesirable Amplitude
Modulation
• Jitter describes the same
effect but horizontally –
timing noise
• Jitter →→→→ horizontal
fluctuations across the
sampling point
• Undesirable Phase
Modulation
Jitter – What Causes It?
• Oscillator Topology• PLL Design• Crystal Performance• Thermal Noise• Shot Noise• Dispersion • Reference Spurious•
Noise Mechanisms
System
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• Radiated or Conducted Signals• Crosstalk• Duty Cycle Distortion mechanisms• Impedance mismatch• Inter Symbol Interference mechanisms• Receiver Detector characteristics• Clock/Data Recovery Design• PRBS Mechanisms
Data Dependent Mechanisms
System Mechanisms
1. Definition and Description of Jitter
2. Understanding Jitter, its Components, and Separation
3. Jitter Measurement Methods and Tools
Jitter Primer: Topics to be Covered
Page 13
3. Jitter Measurement Methods and Tools
Where ϕϕϕϕ(t) is overall system jitter function with many sources.
S(t): a general digital jitter signal and P(t): a pulse train
ϕϕϕϕ (t) is composed of functions ϕϕϕϕ (t) is composed of functions that
S(t)=P(Asin(2ππππfDt+ϕϕϕϕ(t)))
ϕϕϕϕ(t)= ϕ ϕ ϕ ϕ B(t) +ϕ ϕ ϕ ϕ UB(t)
Representing Jitter
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ϕϕϕϕΒΒΒΒ(t) is composed of functions
that have Deterministic
(Bounded) phase deviations
because their max amplitudes
don’t change
ϕϕϕϕUΒΒΒΒ(t) is composed of functions that
have Random (UnBounded) phase
deviations because their max
amplitudes do change. The functions
are characterized by their statistics
Lets Look at the Jitter Sources Again…Oscillator TopologyPLL DesignCrystal PerformanceThermal NoiseShot Noise DispersionReference SpuriousRadiated or Conducted Signals
NoiseRANDOM / UNBOUNDED
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Radiated or Conducted SignalsCrosstalkDuty Cycle Distortion mechanismsImpedance mismatchInter Symbol Interference mechanismsReceiver Detector characteristicsClock/Data Recovery DesignPRBS Mechanisms
Data
System
DETERMINISTIC
BOUNDED
Example Random and Deterministic Jitter
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Deterministic Jitter (DJ): The spacing
between the mean values of the
“earliest” and “latest” traces, JPPDJ
Random Jitter (RJ):
Defined by RMS value, σ, of the Gaussian
distribution
JPPDJσ
Expressing Total Jitter• Usually represented as root-mean-square, Jrms, and peak-to-peak,
JPP
• Most useful to characterize jitter as a combination of JrmsRJ and JPP
DJ
at a given Bit Error Ratio (BER)
Random Jitter (RJ) – results from the accumulation of random processes.
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• Assumed to Follow a Gaussian Distribution RJ contribution to Jrms is Jrms
RJ = σσσσ• Since a Gaussian function is unbounded ,
RJ contribution to JPP can be large JPPRJ →→→→ ∞∞∞∞
Deterministic Jitter (DJ) – results from systematic effects
• E.g., duty-cycle-distortion (DCD), intersymbol inte rference (ISI), periodic jitter (PJ), PRBS effects, and cros stalk
• DJ is bounded , JPPDJ is finite.
Sampling Point
Unit Interval
Gaussian
Jitter Only!
Random jitter: JPPRJ is related to Bit Error Ratio
x
Measure BER(x) = ββββ(x)
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Overlap indicates BER
σL
Sampling Point
σR
µ µ
Jitter Only!
(No DJ)
JPPRJ = n××××σσσσ
Random Jitter JPPRJ : What factor to use ?
JPPRJ = n××××σσσσ
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JPPRJ
Random jitter is UNBOUNDED, if we wait long enough we would have “hits” anywhere in the Eyediagram.
We could use any Berr but 10-12 is quite common to use and 10-12 equals to 14.1 sigma.
So if we measure sigma is 10 picoseconds, then we would say the random jitter is 141 Psec.
Expressing Total Jitter: RJ & DJ combined
• Since JPPRJ is unbounded, it can be defined by the BER that
would result if there were only RJ. This is where the tails of the right and left distributions overlap (at the Sampli ng point):
For a BER = 10-12 →→→→ JPPRJ = 14××××σσσσ
Then JPPRJ ≡≡≡≡ n××××σ σ σ σ so that JPP
RJ =nxJrmsRJ
• The Total Jitter (TJ), JTJ, for a given BER is then:
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DJPP
DJPP
RJrms
TJ
J
JJnJ
+×=
+×=
σ14
This assumes that the Gaussian RJ PDF ‘appends’ to the DJ PDF
This is called the Dual Dirac Assumption
=∗
JPPDJ
The ‘DJ’ The ‘RJ’Total Jitter
7σ
The Dual Dirac Assumption
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=∗ σ
µL
µR
µL
µR
)([ Lx µδ − ∗− )]( Rx µδ+
−
2
2
2exp
σx
−−+
−−=
2
2
2
2
2
)(exp
2
)(exp
σµ
σµ RL xx
No Jitter values
between deltas
Jitter Probability: BER
randomticdeterminispkpk nJJ σ×=−
=
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Random and Deterministic Jitter
JPPDJ
σ = JrmsRJ
• Waveform Observation• Pattern• Note Characteristics
2 Distinct Falling Edges
2 Distinct Rising Edges
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JPP Jrms
Falling Edges Rising Edges
Threshold
Lots of Zeros
Random and Deterministic Jitter• Lets Look at Deterministic Component…
JPPDJ
σ = JrmsRJ
JPPDJ
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JPP Jrms
JLPPDJ JRPP
DJ
JLPPDJ + JRPP
DJ = JPPDJ
The Peak-to-Peak Deterministic value is the Delta b etween Worst case mean trajectories around a crossing poi nt .
Random and Deterministic Jitter• Now lets Look at the Random Component…
JPPDJ
σ = JrmsRJ
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JPP Jrms
σσσσRJ σσσσRJ
σσσσRJ is a measure of the process that makes these traces wide
Random and Deterministic Jitter• Now lets Summarize Jitter for the Circuit Measured…
JPPDJ
σ = JrmsRJ
JPPDJ
σ σ σ σ =JrmsRJ
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JPP Jrms
JPPT
JPPT = n x σσσσRJ + JPP
DJ
� Random Jitter (RJ) unbounded
• Due to thermal noise, shot noise, etc.
• Follows Gaussian distribution
• Requires statistical analysis to be quantified
Total Jitter is composed of random and determistic
components
Total jitter: Histogram View
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• Requires statistical analysis to be quantified
• RJpp = 14.1 x Jrms for 10-12 BER
� Deterministic Jitter (DJ) bounded and composed of:
• Duty-Cycle-Distortion (DCD)
• Inter Symbol Interference (ISI)
• Periodic Jitter (PJ)
RJ
DJ
Deterministic Random
Signal jitter can be composed of several types from several mechanisms
Data-Correlated Data-Uncorrelated
Total
Jitter (TJ)ϕϕϕϕB(t)
Decomposing Jitter: The “jitter tree” DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
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Deterministic
Jitter (DJ)Random
Jitter (RJ)
Inter-symbol
Interference (ISI)
Duty Cycle
Distortion (DCD)
Periodic
Jitter PJ
Data Dependent Jitter
(DDJ)
Example: Duty Cycle Distortion (DCD)
Ideal Threshold
Actual Threshold
Transmitter Threshold Offset Problem
1 1
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
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+ error
TIE Trend Waveform
- error + error - error
Clock
0 0
Note: One technique to test for DCD is to stimulate your system/components with a repeating 1-0-1-0… data pattern.
This technique will eliminat inter-symbol interference (ISI) jitter and make viewing the DCD within the spectrum display much easier.
Example: Duty Cycle Distortion (DCD)
Threshold
Transmitter Edge Transition Speed Asymmetry
1 1
0
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
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- error + error - error + error
TIE Trend Waveform
Clock
0
Example: Inter-Symbol Interference (ISI)
Threshold
Transmission Line Bandwidth Limitation ProblemA
B
C
1
00
1 1 1 1 1 1 1 1 1 1
0 0 0 0 0 0 0 0 0
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
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TIE Trend Waveform
““““A” = 0 preceded by string of 1’s = + error
““““B” = 1 preceded by 0 = - error
““““C” = 1 preceded by string of 0’s = + error
Example: Inter-Symbol Interference (ISI)Transmission Line Reflection / Improper Termination
Data Signal
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
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TIE Trend Waveform
Each arrow shows which bit of data caused a reflection distortion
on a later data bit.
Example: Periodic Jitter (PJ)
Threshold
System Cross-talk Problem (capacitive coupling)
Corrupter
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
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Threshold
TIE Trend
Where Does Jitter Come From?
Transmitter Receiver
•Lossy interconnect (ISI)•Impedance mismatches (ISI)
Media
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
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•Thermal Noise (RJ)•DutyCycle Distortion (DCD)•Power Supply Noise (RJ, PJ)•On chip coupling (PJ)
•Impedance mismatches (ISI)•Crosstalk (PJ)
•Termination Errors (ISI)•Thermal Noise (RJ)•DutyCycle Distortion (DCD)•Power Supply Noise (RJ, PJ)•On chip coupling (PJ)
.
ϕϕϕϕ(t ) = square wave
ϕϕϕϕ(t ) = mess
Different types of jitter ϕϕϕϕ(t) in S(t)=P(Asin(2ππππfDt+ϕϕϕϕ(t)))
Jitter examples for different Jitter Distributions
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ϕϕϕϕ(t ) = AAppl sin (2 ππππ fJ t).
ϕϕϕϕ(t ) = pulse
ϕϕϕϕ(t ) = DDJ Only
A DCD B ISI
Jitter Examples Continued
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C RJ (gaussian)l D Sinusoidal E ISI and DCD
1. Definition and Description of Jitter
2. Understanding Jitter, its Components, and Separation
3. Jitter Measurement Methods and Tools
Jitter Primer: Topics to be Covered
Page 37
3. Jitter Measurement Methods and Tools
Which Eye Has Worse Jitter?
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You can’t know unless you measure the Total
Jitter or measure the jitter components!
A B
Jitter Measurement Solutions from Agilent
• Infiniium Scopes (up to 32 GHz):
• EZJit Software
• EZJit Plus Software
• DCA-J (86100 Series Infiniium 20-80 GHz Scopes)
• Jitter SW package
• Infiniimax Probes to 13 GHz
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• N1930 Physical Layer Test System
• Vector Network Analyzer or Time Domain Reflectometer
• N4900 Series BERTs
• Bathtub curve Extrapolation and RJ/DJ Estimation
• E443x Signal Sources
• E4438C-SP1 Jitter Injection Software
Vector Network analyzer
Bit Error Ratio Tester
Pattern Generator
Transmitter Media Receiver
X
X
X
X
Time domain Reflectometer X
Tools to Measure/Analyze Jitter
X
X
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Time Interval Analyzer
Equivalent time oscilloscope
Phase Noise Analyzer
Real time oscilloscope
Time domain Reflectometer X
X
X X
XX
X
X
Low Noise (RJ) available
Standard Patterns and User Definable Patterns
Flexible for wide variety of technologies.
RJ, PJ, and DCD can be created.
Pros
Cons
Jitter Tolerance Testing (w/Pattern Generators)
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Cost Range: Modestly to Highly Expensive
Intersymbol Interference is not available.
Complex sequencing not available.
Cons
SinusoidalSquare
Tolerance Testing (using a Pattern Generator)
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Sinusoidal, RJ and ISI*
* Created with cable length
Measures Total Jitter Directly
Can Provide good estimate of total Jitter quickly with BERTScan method
System Tool: Usable for Media analysis, receiver stress analysis
J-Bert N4903B available for jitter stress test
Pros
Jitter Analysis (BERTs)
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Expensive
Time of Measurement of Total Jitter is Long
Need an external clock provided
Cons
Scan the sampling point, x, across the eye
Scan the sampling point across the eye
Measure BER(x) = ββββ(x)
Jitter Analysis: BERT BathTub Curve
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TB0
0.5
10-3
10-6
10-9
10-12
BE
R
GaussianTails
0.5TB
Eye Opening atBER=10-12
β(x) ⇒ TJβ
x
Measure the Bit Error
ratio as a function of sampling point delay,
β(x)
Expensive
50 GHz BW available yields high
resolution
Highest Accuracy
VNAs TDRs
InExpensive
Limited by rise time of Pulse
source (35ps)
Accuracy may be sufficient in
Jitter Analysis: N1951A PLTS with Vector Network Analyzers
(VNAs) or Time Domain Reflectometers (TDRs)
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Highest Accuracy
Full Differential Analysis
analysis to show EMI, mode
conversion locations
Software Modeling and Analysis
Available
S-Parameters for modeling or to
estimate ISI contribution of path
Accuracy may be sufficient in
many environments. Using
Normalization to increases
accuracy
Only magnitude TDT and TDR
Software Modeling and Analysis
Available
Differential Eye Diagram (from Agilent N1951A: VNA System)
Xaui Backplane differences because of transmission line length
30 inches15 inches
N1951A VNA Measurement of XAUI Backplane
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Note increased striation because of BW limit of path
Note degree of eye closure
•Captures contiguous time record
•No external clock required
•Software clock recovery methods yield precise clock reconstruction
•System Tool: Usable for Debug
•Flexibility for many technologies and usually a growth path provided
•Many views provided for insight: histograms, eyes, fft, trend, data, etc
•Oscilloscope Bandwidths are going higher
Pros
Jitter Analysis (Real Time Oscilloscopes)
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•Many views provided for insight: histograms, eyes, fft, trend, data, etc
•Oscilloscope Bandwidths are going higher
•Expensive
•Limited to current BW of scope
Cons
Agilent Infiniium Series Oscilloscopes
� High Bandwidth Models up to 32 GHz & 80 GSa/s per channel
� Deepest memory in the market up to 2 Gpoint per channel
� MegaZoom usable deep memory
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� MegaZoom usable deep memory
� Mixed Signal Oscilloscope (MSO) models available
� Windows-Based Easy to Use GUI
� Drag-and-Drop easurements
� Zoom box
� Wide variety of analysis options
How Do Real Time Scopes Measure Jitter on Data: Ezjit Display
Jitter Trend
NRZ Serial Data
Recovered Clock
Page 49
Trend
Jitter Spectrum
Units in Time
Units in Freq.
Jitter Histogram
Agilent E2681A EZJIT Jitter Measurement Application for Infiniium Oscilloscopes
Signal
Trend
Histogram
Page 50
Trend
Spectrum
• Real Time (Single-Shot)
• Sequential Sampling (Repetitive)
Sampling Techniques
Page 51
• Used with either Repetitive or Single-Shot Signals
• All Samples Are Taken From a Single Trigger
• Samples from Previous Triggers are Erased
• Sample Rate May Limit Scope’s Overall Bandwidth
• Best Resolution Depends Directly on Sample Rate
Real Time (Single Shot) TechniqueSampling
Page 52
• Best Resolution Depends Directly on Sample Rate
EachTrigger
Identical
• Used ONLY with Repetitive Signals
• One Sample is taken for each Trigger
• Multiple Trigger Events Build Up Waveform
• Used in High Speed Applications with BW >10GHz
• No Pre-Trigger Information
Sequential Sampling TechniqueSampling
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• No Pre-Trigger Information
1st Trigger2nd Trigger3rd Trigger
InExpensive
Bandwidth is Highest Available
Noise floor is good
Pros
Jitter Analysis (Equivalent Time Sampling Oscilloscopes)
Page 54
Noise floor is good
TDR options for media analysis
Flexibility for increasing rates
Industry leading jitter separation algorithm (DCA-J)
External Clock or Clock related trigger is required or
Hardware Clock Recovery Module
Cons
Jitter Analysis (Equivalent Time Oscilloscopes)
A
Page 55
B
Which Eye Has Worse Jitter? DJPP
DJPP
RJrms
TJ
J
JJnJ
+×=
+×=
σ14
Page 56
A B
Jitter Measurements on an equivalent Time
Sampling Oscilloscope, 86100C DCA-J
Completely new technique for jitter analysis
Pattern Lock + Eyeline
internally generated pattern trigger + individual trajectories /
averaged eyes
���� Jitter Mode – jitter analysis at any data rate!
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���� Jitter Mode – jitter analysis at any data rate!
“Swiss army knife”
• Wide bandwidth scope
• eye-diagram analysis
• Time Domain Reflectometer
• Jitter analyzer
DCA-J Measurement Architecture• Eliminate historical weaknesses
• New triggering hardware enables efficient sampling
• Built in pattern trigger – Pattern Lock
Page 58
• Determines pattern length and counts clock pulses
• Enables precise sampling position within the eye so every
sample is used for jitter analysis
• Minimizes errors from timebase delay
Separate Correlated and Uncorrelated Jitter
Uncorrelated:
• Counter hardware focuses samples on edges
• Pattern lock – focus on specific edges
• Analyze jitter uncorrelated to the pattern:
random jitter and periodic jitter (RJ ∗∗∗∗ PJ)
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 59
Correlated:
• Pattern lock – average every
edge
• Analyze jitter correlated to the
pattern:
data dependent jitter (DDJ)
Obtain DDJ vs. Bit record of edge positions• DDJ for a given edge is the difference
Data Dependent Jitter (DDJ)Average out the uncorrelated jitter using Pattern
Lock• Isolates data-correlated contributions only
Measure mean position of every edge in pattern• Ideal edge position defined mean of means
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 60
• DDJ for a given edge is the difference between its average position and the ideal
• Peak-to-peak DDJ is difference between earliest edge and latest edge
Build histograms for• All edges• Rising edges• Falling edges
Duty Cycle Distortion (DCD) &
Inter-Symbol Interference (ISI)
• Isolate rising edge data from falling edge data
• Difference of average locations is JDCD
• |µµµµFalling - µµµµRising|
• Maximum of the peak-to-peak values is JISI
• Max (P-to-PFalling , P-to-PRising)
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 61
µF µRDCD
DDJ
P-PF
P-PR
Data-Uncorrelated JitterFocus on only one edge at a time• Isolates uncorrelated contributions
Build a time sampled record• Periodic samples of uncorrelated jitter
Late
Early
Time
Jitte
r
Counter hardware provides
precise periodic sampling
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 62
Early
Build a histogram of uncorrelated jitter• RJ, PJ Histogram
Late
Early
Time
Jitte
r
FFT time sampled record• Aliased jitter frequency spectrum• Shows RJ & PJ – PJ appears as spikes
Random Jitter (RJ) DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 63
Integrate ‘noise’ power in resultant spectrum…• This is the random jitter (RJ)
Remove PJ spikes from spectrum• Interpolate across gaps left behind• Resultant spectrum is made up of RJ
PJ spikes NOT
used to derive
PJ value
Periodic Jitter (PJ)
Take RJ info from FFT and construct a Dual Dirac-delta model with appropriate slopes
Match Dual Dirac-delta model to RJ, PJ
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 64
Match Dual Dirac-delta model to RJ, PJ histogram so that peak-peak widths match for
99.8% of volume
Separation (offset) of two Gaussians corresponding to the match is the
periodic jitter (PJ).
Deterministic Jitter (DJ) and
Total Jitter (TJ)
• DDJ histogram (Data-Correlated)
and RJ, PJ histogram (Data-
Uncorrelated) are measured
directly
• Convolution of these histograms *
DDJRJ, PJ
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 65
• Convolution of these histograms
produces a histogram
representing the PDF of all of the
jitter present – Total Jitter
histogram
*Aggregate
Jitter
Deterministic Jitter (DJ) and
Total Jitter (TJ)
Match Dual Dirac-delta model to TJ histogram so that peak-peak widths match for 99.8% of volume
• Same technique as used to get PJ from RJ, PJ PDF
Take RJ info from FFT and construct a Dual Dirac-delta model with appropriate slopes
DJ
DJ RJ
DDJ
ISI DCD
PJ
Correlated UncorrTJ
Page 66
Extrapolate down the resultant Dual Dirac-delta model to the effective BER of interest
(typically 10-12) peak-to-peak deviation is TJ
DJ Separation (offset) of two Gaussians corresponding to the match is the
deterministic jitter (DJ)
Seeing the Complete Jitter Picture
Page 67
New: N5400A EZJIT Plus Jitter Separation
= DCA-J algorithm on a real-time oscilloscope
Page 68
N5400A EZJIT+ simplifies jitter compliance
Page 69
EZJIT and EZJIT Plus Measurements• E2681A EZJIT Jitter Analysis
• Single-Source
• Period
• Frequency
• Positive/Negative pulse width
• Duty cycle
• Rise/Fall time
• Dual-source
• Setup/Hold time
• Phase
• Clock
• N5400A EZJIT Plus Additions*
• RJ/DJ Separation Components
• Random jitter (RJ)
• Deterministic jitter (DJ)
• Data-dependent jitter
• Inter-symbol interference (ISI)
• Duty cycle distortion (DCD)
• Periodic jitter
• Total jitter at user-selectable bit error rate
• Display Views
• RJ/PJ histogram
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• Clock
• Time-interval error (TIE)
• Cycle-to-cycle jitter
• N-cycle jitter
• Cycle-cycle positive/negative pulse width
• Cycle-cycle duty cycle
• Data
• Time-interval error (TIE)
• Data rate
• Unit Interval
• RJ/PJ histogram
• TJ histogram
• DDJ histogram
• Composite histogram (TJ, DDJ, RJ/PJ)
• Jitter spectrum (zoomable)
• DDJ vs. bit (for repeating patterns)
• Bathtub curve (eye-opening vs. BER)
• N5400A and E2681A common display views
• Measurement trend
• Histogram
• Jitter spectrum *N5400A includes all features of E2681A
as well as the following
• Jitter is a complex phenomena and understanding and measuring it can be as
well.
• Having a Total Jitter to achieve a desired Bit Error Ratio is the main goal for any
digital interface.
• Jitter Separation is an Enterprise Jitter methodology to deliver an estimate of
Total Jitter quickly.
• There are many methods to separate jitter in our next paper we will see they can
give different results. The results for TJ are often 15-25% in error—almost
Summary
Page 71
give different results. The results for TJ are often 15-25% in error—almost
always an overestimate of TJ.
• There are many tools that can be used in the testing for jitter. Which ones you
select are dependent on your tasks, future projects, size, and your comfort level.
www.agilent.com/find/jitter Jitter meas. solutions
www.agilent.com/find/jitter_info Jitter app. info.
www.agilent.com/find/si Signal Integrity Solutions
Results Agilent Jitter Accuracy Study (Jitterfest 3)
TJ Estimate vs Actual TJ
225
300
Fas
t TJ
Est
imat
e (p
s)
BERT
TRUE
DCA-J
DSO81304A/N5400A EZJIT Plus
Page 72
0
75
150
0 50 100 150 200 250Actual TJ (ps)
Fas
t TJ
Est
imat
e (p
s)
DSO81304A/N5400A EZJIT Plus
AGENDA 1. Jitter:
I. Definition and Description of Jitter
II. Understanding Jitter, its Components, and Separation
III. Jitter Measurement Methods and Tools
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2. Actual jitter measurements
Actual Jitter Measurements• 86100D as jitter analyzer
• 81134A as pattern generaror
• Demo 1: measure ISI jitter with bnc cable as “ISI injector”
• Demo 2 : measure uncorrelated Pj and Resolve Pj frequencies
with MXG as uncorrelated Pj source
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with MXG as uncorrelated Pj source
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•Questions?