“Jitter measurement by electro-optical sampling” · 2013. 6. 13. · To TEO exp. Feedback...

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“Jitter measurement by electro-optical sampling” VUV-FEL at DESY - Armin Azima S. Duesterer, J. Feldhaus, H. Schlarb, H. Redlin, B. Steffen, DESY Hamburg K. Sengstock, Uni Hamburg Adrian Cavalieri, David Fritz, David Reis, Michigan University Ann Arbor, Michigan

Transcript of “Jitter measurement by electro-optical sampling” · 2013. 6. 13. · To TEO exp. Feedback...

Page 1: “Jitter measurement by electro-optical sampling” · 2013. 6. 13. · To TEO exp. Feedback signal • FWHM 500fs, very sensitive to phase compensation • Read out every minute

“Jitter measurement by electro-optical sampling”

VUV-FEL at DESY

-

Armin Azima

S. Duesterer, J. Feldhaus, H. Schlarb, H. Redlin, B. Steffen, DESY Hamburg

K. Sengstock, Uni Hamburg

Adrian Cavalieri, David Fritz, David Reis, Michigan University Ann Arbor, Michigan

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The VUV-FEL

Tunnel

TEO

e-

λFEL-

experimental hall• Wave length of VUV-λλ : 15 - 50 nm (now) • Energy per VUV- pulse: up to 150 µJ

• Charge of electron bunch: 1nC• Energy of electron bunch: 480 MeV• Duration of UV-pulse / e--bunch : ≈ 20-70fs

Bending magnet

UndulatorAccelerator (TESLA)“SASE” – self amplified spontaneous emission

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Time-resolved “pump-probe” measurements

Variable delay:100 fs = 30 µm

We need 2 laser pulses :

• One initiating a reaction (so-called “pump”)• Second one looking what happened ( so-called “probe”)• Doing the same measurement with different set of pulses and delays

multiple times, scans the evolution of the reaction time-resolved.

→→ PumpPump--probeprobe experimentexperiment

Jitter !

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Problem

• Jitter of arrival time of VUV-FEL pulse is of the order of 500fs-1ps RMS on a long time scale (hours) and of 100-200fs for a short time scale (minutes).

• There is no easy way to correct this.

→→ Solution:Solution: Measurement of relative arrival time between opt. laser pulse and FEL pulse and “sort” data points afterwards to correct jitter

“Jitter-problem is reduced to the problem of measuring the jitter”

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delay

„ideal“ PP-Experiment

delaydelay + jitter

delay + jitter

„Real“ FEL experiment

sort data points

Sorting pump-probe data

→ Jitter measurement done by the Timing by Electro-Optical sampling exp., “TEO”“TEO” - Experiment

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The Timing electro optical samplingexperiment

• TEO: “Timing electro optical sampling”

– correlation between an optical laser pulse and the electric field of an electron bunch

– based upon Pockel’s effect

• Purpose:– jitter measurement for pump probe experiments– electron bunch analyzing

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Δt

TiSa TiSa --Laser Laser

oscillatoroscillator

TEO with EO-crystal

150m bulk single mode polarization maintaining glass fiberglass fiber

Pump probe Experiment

e-O

PA

Am

plifi

erD

elay

line

VUVVUV--FELFEL

Undulator

synchronizationpump / probe synchronizationpump / probe synchronizationsynchronization

e-

e-

∆te-

∆t’γ

•Laser puls FWHM ΔtFWHM = 60fs

•Phase-loop-locked to FEL master oscillator

Δt = Δt’ ± 60fs shown by “Cavalieri et al., Phys. Rev. Letters., 94, 114801 (2005)”

Timing-Electro-Optical principle

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TEO signal detection

kv

kv

kv

kv

kv EO crystal

(ZnTe, 300µm) (new GaP,180µm)

kv

kv

kv

kv

kv

kv

kv

kv

kv

kv

Laser probe later

relative to electron bunch

Laser probe earlier

relative to electron bunch

Electron bunch

Idea: map temporal information into space

e- e-e- e- e-

Laser pulse

Rotation of polarization ~ , which is ~ , the longitudinal electron density)(zρ

Er

• Technique pioneered using table-top systems by Heinz et. al., Opt. Lett, 25, 426 (2000)

!

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polarizing beam splitter

laserkvtim

e; space

• Arrival timeArrival time and duration of bunchduration of bunchis encoded on profile of laser

p polarizedk −

v ICC

D

cam

era

tim

e

tim

e

integrated intensity

--00

+10ps+10ps

--10ps10ps

Temporal resolution of PumpTemporal resolution of Pump--Probe exp. is given by the precision of Probe exp. is given by the precision of the jitter measurement, which will be better than the jitter measurement, which will be better than 50 50 fsfs..

TEO signal detection

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Dispersion during pulse transport

• Transport of laser pulse

• Pulse in fiber will be broadened ((50 fs to 0,4 ns) 50 fs to 0,4 ns) and distorted due to high order dispersion (~100 pulses seen)(~100 pulses seen)

•• Temperature change delays pulse due to fiber expansion Temperature change delays pulse due to fiber expansion fiber length compensation necessary feedback loopfiber length compensation necessary feedback loop

150m

in Tunnel

TEO

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Feedback signal measurement

BBO

Feedback signal

Oscillator pulse

(60fs FWHM)

To TEO exp.

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Feedback signal

• FWHM 500fs, very sensitive to phase compensation

• Read out every minute

• Mean feedback signal delay measured by feedback loop from day to day: ~10-15 ps

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TEO overview

FEL beam Experiment

Amplifier

fs-laser oscillator(50 fs, 3 nJ, 800 nm) Optical diode

Feedback signal for changes in fiber length

Grating compressor:compensation for first order dispersion

Pulse shaper:Higher order compensation

Fiber lengthcompensation

150 m long glass fiberto transport laser pulsesinto the accelerator tunnel

Pockelscell:Pulses needed for EOS can pass- the others are reflected providing signal for the fiber length stabilization

150 m to experiment

Undulator Linac

Ampl

ified

lase

r bea

m

(150

fs,1

00µJ

, 800

nm

)30

m to

exp

erim

ent

Compressor + pulse shaper + 150 m glass fiberhave

laser pulses after the fiber are short againtogether no dispersion:

puls length: 50 fs(~ 0.3 nJ)

Electrons

CCD

ZnTe crystal= actual EO-sampling

Pockels cell

50 % beam splitter

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Jitter measurement – comparison

• Timing Electro-Optical Sampling

• Dipole light and streak camera

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Jitter measurement - Streak camera

Streak camera – temporal resolution 2ps

opt. laser pulse

“Dipole light”

Δt

5

-5

arriv

al ti

me

[ps]

0

Jitter RMS 0.8 ps for 6 hours

60 time [hours]

opt. laser pulse

V

Streak camera

time

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Jitter measurement –Streak camera vs. TEO

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Electron bunch analysis

• Transverse RF cavity electron streak camera

• Electro-optical sampling with temporal decoding

• Timing Electro-Optical Sampling

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Accelerator phase tuning –LOLA and EOS

Compressed Δ1° Δ2° Δ3°

Electron bunch structure Electron bunch structure measured by LOLA, EOS temp and TEO

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Conclusion & Outlook

• built a system, that provides jitter data for user pump-probe experiments

• by now we have a 200 – 300 fs resolution for the measured jitter

• Electron bunch shape can be monitored online and noninvasive

• changed crystal from ZnTe (wedged) to GaP, plain, 180µm thickness

Still to do:

− Compare with a Pump Probe experiment

− improve time resolution and signal strength

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Acknowledgments

Thanks are going to:

Photon diagnostic:Stefan Duesterer, Harald Redlin, Josef Feldhaus

Accelerator group:Holger Schlarb, Bernd Steffen, Peter Schmueser

and Klaus Sengstock.

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END

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Experimental results TEO

•10-90% edge rise time: 300fs

• Amplitude and signal to noise ration varies strongly

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Pump-probe exp. with VUV-FEL

Laser hutch

Experiments

Precision of temporal overlap shall be better than 50fs

Optical laser pulseOptical laser pulse

VUVVUV--FEL pulseFEL pulse

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• Measurement of longitudinal beam profile with transverse deflecting RF-cavity

• Electron bunch is “streaked”

• Temporal resolution ~10fs

e-Bunchstreak camera – “LOLA”

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Electro-Optical-Sampling by Temporal Decoding (EOS)

Source: Bernd Steffen, DESY

• e--electron density is encoded spectrally and temporally

• The temporal information is read out by a nonparallel cross-correlation with the uncompressed bunch (convolution with a “delta”-peak)

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Time structure

t

I 200ms

t

I 800μs (~10 μs)

Macro-pulse duration

It

I1.0 μs

bunch spacing

20 fs VUV / 60 fs TiSa

• Macro pulse

• Electron bunch / photon pulse

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Comparison with LOLA and EOS

• Phase of accelerator field 10.94Deg Almost perfect bunch compression