RTU1A-5
description
Transcript of RTU1A-5
RFIC – Atlanta June 15-17, 2008
RTU1A-5
A 25 GHz 3.3 dB NF Low Noise Amplifier based upon Slow Wave
Transmission Lines and the 0.18 μm CMOS Technology
A. Sayag(1), S. Levin(2), D. Regev(2), D. Zfira(2),
S. Shapira(2), D. Goren(3) and D. Ritter(1) (1) Department of Electrical Engineering, Technion, Haifa, Israel
(2) Tower Semiconductors inc., Migdal HaEmek, Israel(3) IBM Haifa Research Laboratories, Haifa, Israel
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Outline
• Low Noise Amplifier design methodology
• New semi-analytic model for slow wave
transmission lines
• LNA performance
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Motivation
• Can we get close to the transistor minimum
NF in 24GHz LNA design?
Best 0.18 μm 24 GHz LNA: NF=3.9
[Shih-Chieh Shin et al., IEEE MWCL, 2005.]
@ 24GHz
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LNA Design Methodology
1. Determine the optimal current density
2. Determine critical circuit element values
3. Choose the transistor width
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Transistor Performance Determined by Current Density
@ 24GHz
@ 24GHz
@ 24GHz
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Transistor Performance Determined by Current Density
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Circuit Topology: Common source with inductive source degeneration
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Source Inductor value for each Width
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Example: Source Inductor for W=40μm
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How does the Insertion Loss of the Input Matching Network Depend on Transistor Width?
Equal Insertion loss contours
•Each point on the Smith Chart corresponds to a hypothetical transistor input impedance
•Input impedance is matched to 50 ohms by a matching network with inductors having Q=20
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Insertion Loss Map of the Input Matching Network with Q = 10
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Insertion Loss Map of the Input Matching Network with Q = 30
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We need Q > 20 !
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Choosing the Transistor Widths (assuming a two identical stage amplifier)
1
21
1
G
NFNFNFtotal
W [um] Transistor Max
Gain [dB]
Min NF [dB] gs [dB] NF total [dB]
20 7.2 0.82 0.3 1.2
40 8 0.9 0.8 1.3
80 8.2 1 1.44 1.6
*gS - normalized source gain factor
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Choosing the Transistor Widths (assuming a two identical stage amplifier)
W [um] Max Gain [dB] Min NF [dB] gs [dB] NF total [dB]
20 7.2 0.82 0.3 1.2
40 8 0.9 0.8 1.3
80 8.2 1 1.44 1.6
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High Q Slow Wave Transmission Lines
2SiOeff
2SiO
Si
• Effective dielectric constant larger than that of the surrounding dielectric material
• The effective dielectric constant determined by geometry
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Properties of Slow Wave TL
• Isolation from the lossy silicon substrate
• Shorter wavelength shorter matching networks
• Lower loss per wave length higher Q of resonators
• Smaller die area
• Higher characteristic impedance
• Complicated EM simulations
• Complicated layout
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Measured and Simulated Slow Wave Transmission Line Parameters
twice the effective dielectric cons. of SiO2
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Properties of Slow Wave Transmission Line
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Our Compact Analytic RLCG Model of Slow Wave Transmission Lines
*A. Sayag et al., submitted to TMTT
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Using our Compact Model to predict Slow wave TL performance
W
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Low Noise Amplifier
•All the matching networks are slow wave transmission lines
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Measured and Simulated Performance
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Simulated Noise Contributions
• Transistors: 70%
• Transmissions lines: 23%
• Capacitor parasitics: 7%
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Comparison with State of the Art LNAs
mWPdBNF
GHzBWdBGainFOM
D
1
[1] Shih-ChiehShin et al., IEEE Microwave and Wireless Component Letters, July, 2005.[2] E. Adabi et al., " RFIC Symposium, June 3-5, 2007, Honolulu, Hawaii.
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Conclusions
• LNA design methodology presented.
• New analytic model of slow wave transmission lines.
• Record 2.8dB NF @ 24 GHz obtained using 0.18 μm technology.
• Slow wave transmission lines contributed only 23% of the total noise.
• Lower NF should be achieved using more advanced technologies
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Thank You!
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Testing our model: Comparison between Slow Wave Transmission Line and
Grounded Coplanar Waveguide
Grounded coplanar Slow wave
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Comparison of Slow Wave and Grounded Coplanar Waveguide
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Comparison between Slow Wave Transmission Line and Coplanar Waveguide
Coplanar Waveguide slow wave
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Comparison between Slow Wave and Coplanar Waveguide