Mössbauer spectroscopic microscope

for Fe chemical analysis

PITTCON2016

14.4keV g-rays: 0.1

Conversion & Auger

Electrons: 2

57Co

14.4 keV

57Fe

57Fe Mössbauer Effect

Nelectrons~ NFe

57Fe

matrix

g-ray source

g-ray: 1

Sample

57Fe Mössbauer Effect

PITTCON2016

PITTCON2016

MCP

x-y stage

Sample

MCX

Velocitytuning

MössbauerDrive57Co

γ-rayDetector

g-rayfocusing

g-raydetection

e-

electrondetection

Stagemapping

Mössbauer spectroscopic mapping

Mössbauer spectroscopic mapping-Basic concept

JASIS2015

The appearance of the Mössbauer spectroscopic microscope

The components of the Mössbauer spectroscopic microscope

PITTCON2016

PITTCON2016

MCP

x-y stage

Sample

MCXMössbauer

Drive57Co

γ-rayDetector

e-

Velocity tunningControl at a constant velocity and constant acceleration

Error of less than 0.05 mm / s

PITTCON2016

PITTCON2016

-15.0

-10.0

-5.0

0.0

5.0

10.0

15.0

0 2500 5000 7500 10000

Ve

loci

ty [m

m/s

ec]

Time [msec]

-15.0

-10.0

-5.0

0.0

5.0

10.0

15.0

0 2500 5000 7500 10000

Ve

loci

ty [m

m/s

ec]

Time [msec]

Constant velocity mode

Constant acceleration mode

PITTCON2016

MCP

x-y stage

Sample

MCXMössbauer

Drive57Co

γ-rayDetector

e-g-ray focusing

14.4-keV-g-ray to 100 μmφ

PITTCON2016

MCX (multi-capillary X-ray) lens

（株)応用科学研究所・副島啓義

PITTCON2016

275 μm

Mapping by a collimator with a diameter of 200 μm (1x1 mm2)

g-ray focusing14.4-keV-g-ray to 75 μmφ

PITTCON2016

MCP

x-y stage

Sample

MCX

Velocitytuning

MössbauerDrive57Co

γ-rayDetector

g-rayfocusing

g-raydetection

e-

electrondetection

Stagemapping

Mössbauer spectroscopic mapping

mc-Si solar cell

30x30 mm2

Electrodes for EBIC

PITTCON2016

PITTCON2016

Mapping images for each Mössbauer component

(A) Fes0 (B) Fei

0 (C) Fei＋

-2 -1 0 1 2

99.5

100.0

A B

C

(a) (b) (c)

(d) (e)

Velocity/ mms-1N

orm

aliz

ed t

ransm

issi

on

1 mm 1 mm 1 mm

PITTCON2016

57Fe deposited region of mc-Si wafer

EPMA mapping

EPMA, PL and MSM mapping of intentionally contaminated mc-Si wafer by 57Fe

Fe

Pl mappingMSM image overlapped with SEM image

Fe

FeI0

FeS0

FeI+1

PITTCON2016

MCP SEMEBSDHV-CSAObservation of the same area

Easy operation for changing

different evaluation techniques!

Remote control from the PCby a LabVIEW program

PITTCON2016

PITTCON2016

SEM Scattered electron imageEBIC

EBSD:Pattern Quality EBSD: Inverse pole figure

Complement of the Mössbauer spectroscopic mapping

1mm

EBIC mapEBSD mapping

Transmitted γ-raysMSM Electron mapping

Observations of Mc-Si solar cell by EBIC, EBSD, & MSM

PITTCON2016

FZ-Si (2.71015B/cm3)

57Fe thickness : 50nm

20nm0nm

50nm 70nm

Ag thickness

10mm

10m

m1mm

1mm

Ag thickness : 20nm~210nm

Mapping image of 57Fe + Ag deposited FZ-Si

3D image

PITTCON2016

HAXPES with FOCUS HV-CSA

Conversion and Auger electrons due to Mössbauer Effect Electrons will lose kinetic energies in solid, providing a possibility for

3D-mapping

JASIS2015

Operation system for MSM

JASIS2015

Development for adjusting instruments by SIST

可動式鉛シールド/鉛シールド付MCX位置・角度調整機構/ドライビングユニット位置・角度調整機構可動式HV-CSA位置・角度調整機構MCXレンズ特性評価用位置・角度調整機構

JASIS2015

Team Leader： Yutaka YOSHIDA （SIST）http://www.sist.ac.jp/~yoshida/

Sub-leader： Keiko Ogai （APCO）, H. Soejima (SIST)

http://apco-jp.com/

Acknowledgements to: Bruker AXS K.K., Hamamatsu Photonics K.K.,

Kohzu Precision Co. Ltd, and Scienta Omicron/FOCUS GmbH