Standard System Characteristics

Mechanical System Characteristics:Maximum test sampledimensions: 300mm x 400 mm x 20mmTest contacts: standard: maximum 192

customized: no limits

Electrical System Characteristics:Stimulation: voltage 2-100 V, if resistance >> 1 kΩΩ

(1-50V) (50 ΩΩ);device dependant current (AC/DC): 0-2 A

Luminance: 1 cd/m2 to 200000 cd/m2

Currentmeasurement range: 0,1 µA - 1 A

Highlights:Wide luminance dynamic rangeVarious contact pins in size and number availableCustomized test adapterFlexible test- and measurement software

Options:Contact checkCurrent control: 20 mA-1 A (5o ΩΩ)Calibration equipmentDC-measurement option (±2V)Database connecting to local or customized DBPneumatic adapter for automated tests

PP RR OO DD UU CC TT SS

Science & EngineeringApplications DatentechnikGmbH

Linder HöheD-51147 Köln

Phone: +49 - 22 03 / 9 80 07 - 0Fax: +49 - 22 03 / 9 80 07 - 14

Web: www.sea-gmbh.comMail: info@sea-gmbh.com

Product and company names listed are trademarks or tradenames of their respective companies. August 2006

Science & EngineeringApplications DatentechnikGmbH

industrially approved

customized system

turnkey solution

high performance

reproducable test results

wide dynamic range for tests of nearly allsemiconductors

high performance test adapter with changeablesample holder for device specific adptation

Performance

View

The software of the IVL Test Platform is based on the TestMastersuite, a solution proven in numerous industrial production and R&Dtesting applications. The system is suitable for testing of diverse (O)LED materials used in today's display production. Complete sys-tems for production tests of (O)LED display devices are available.

Apart from the basic TestMaster and other test platforms, our rangecomprises the SpaceMaster system for fiber optics and theMeasureMaster for audio and video testing and analysis.

Consulting & Service

S.E.A. has been a successful provider of system integration solu-tions in measurement and automation technology for more than adecade. You can benefit from this experience by requesting ouradvice. Our services range from the customization of our test solu-tions to the development and integration of turnkey systems.

S.E.A. has expertise in optical measurements and vision inspectionsystems. Please ask our experts - they will be glad to submit a pro-posal addressing your specific testing needs.

PC based IIVVLL TTeesstt PPllaattffoorrmm with testadapter, 19” rack, including pulsegenerator, meter, multiplexer, stimu-lation, and measurement electronics

IVL Test PlatformTest System for Current-Voltage-Luminance Characteristics

Leonardo da Vinci (1452-1519)

IIVVLL TTeesstt PPllaattffoorrmm user interface with contact check area, calibration,parameter definition, and module for automatic sequencing

left: IVL report sheet

The IVL Test Platform developed by S.E.A. is a complete test system for measuring the I-V-L (current-voltage-luminance ) charac-teristic of optical semiconductor components. The system is customized for any kind of (O)LEDs or pixel constellations. The turn-key test system consists of high-quality hardware and software with a standard stimulation and measurement equipment plusthe customized test adapter system.

IVL Test PlatformTest System for Current-Voltage-Luminance Characteristics

All our knowledge has its origins in our perceptions.

Optional production fieldbus interfaces are available forsmooth integration of the IVL Test Platform into produc-tion facilities.

Hysteresis:Cyclic up-and down-ramping of the L-I

and I-V (top down) curve in forwarddirection with two different numbers of

pulses

Parameters were: 25Hz, 0.4ms width.

above: Scheme of test priciple: The sample is fixed in a sample holder pressedonto the contact pins by the optical sensor head. The electrical stimulation isperformed from the bottom and the optical measurement from the top side.

Hardware

The hardware consists of a rackbased system, including all necessa-ry stimulation and measurementhardware. The test adapter allowsthe automated contact of semicon-ductor devices, plates, and samples.The system is delivered always cus-tomized as it supplies the opticalsensor and electronic as well. Thistest adapter can be produced accor-ding to the dimensions of the testdevices and can respectively be tai-lored.

Double contacts allow resistance measurements and contact checkbefore starting the measurement. Mechanical contacting can be donemanually within laboratory setup, but also via pneumatic control forautomated production tests. The changeable inlet of the test adapterallows easy adaption to other sample designs.

System

The high performance measurement hardware for the optical andelectrical measurements is built by S.E.A. The measurement rangeof IVL Test Platform can be further adapted to customer specificneeds.

The standard system can measure luminance levels from 1 cande-la/m2 up to 20000o cd/m2 and handle all kinds of semiconductordevices with stimulation voltages of up to 100 Voltpp and 2 Ampereof current per device. The system can manually measure single sti-mulation points at certain DC or pulsed signals as well as transferfunctions by automated sequential tests. The sequential tests allowperforming aging tests.

Software

The software controls thecomplete setup and measu-rement process.

Predefined test setups andtest sequences can be sto-red and retrieved for fasttest preparation. Long termtesting or sequential testingwith various parameters isperformed with the test sequence engineof TestMaster®, a dedicated softwareproduct for testing of semiconductors orcomplete electronic assemblies.

The software is based on LabVIEWTM fromNational Instruments and supplies an easyto use graphical user interface with manyoptions to parametrize individual testsetups.

The optical and electrical units of the tes-ter are delivered factory pre-calibrated.Calibration models allow calibrating theoptical signals on demand with an exter-nal photometer. The opportunity is givento perform a relative or an absolute cali-bration for each individual device.

Test adapter and measurement electronicshardware rack of the IIVVLL TTeesstt PPllaattffoorrmm

above: Comparison measurements in DC and pulsed mode give the same results. Reverse results differ because of the RC-behaviour of the sample design.

Measurement of single or multi-pixel devices can be realized by amodular switching concept.

Acquired data can be stored within ASCII files or in a database sys-tem to allow the correlation of different measurements. Each testcan produce a customized report sheet, which covers the productdata as well as the test results in alphanumeric and graphical form.

Leonardo da Vinci (1452-1519)

IIVVLL TTeesstt PPllaattffoorrmm user interface with contact check area, calibration,parameter definition, and module for automatic sequencing

left: IVL report sheet

The IVL Test Platform developed by S.E.A. is a complete test system for measuring the I-V-L (current-voltage-luminance ) charac-teristic of optical semiconductor components. The system is customized for any kind of (O)LEDs or pixel constellations. The turn-key test system consists of high-quality hardware and software with a standard stimulation and measurement equipment plusthe customized test adapter system.

IVL Test PlatformTest System for Current-Voltage-Luminance Characteristics

All our knowledge has its origins in our perceptions.

Optional production fieldbus interfaces are available forsmooth integration of the IVL Test Platform into produc-tion facilities.

Hysteresis:Cyclic up-and down-ramping of the L-I

and I-V (top down) curve in forwarddirection with two different numbers of

pulses

Parameters were: 25Hz, 0.4ms width.

above: Scheme of test priciple: The sample is fixed in a sample holder pressedonto the contact pins by the optical sensor head. The electrical stimulation isperformed from the bottom and the optical measurement from the top side.

Hardware

The hardware consists of a rackbased system, including all necessa-ry stimulation and measurementhardware. The test adapter allowsthe automated contact of semicon-ductor devices, plates, and samples.The system is delivered always cus-tomized as it supplies the opticalsensor and electronic as well. Thistest adapter can be produced accor-ding to the dimensions of the testdevices and can respectively be tai-lored.

Double contacts allow resistance measurements and contact checkbefore starting the measurement. Mechanical contacting can be donemanually within laboratory setup, but also via pneumatic control forautomated production tests. The changeable inlet of the test adapterallows easy adaption to other sample designs.

System

The high performance measurement hardware for the optical andelectrical measurements is built by S.E.A. The measurement rangeof IVL Test Platform can be further adapted to customer specificneeds.

The standard system can measure luminance levels from 1 cande-la/m2 up to 20000o cd/m2 and handle all kinds of semiconductordevices with stimulation voltages of up to 100 Voltpp and 2 Ampereof current per device. The system can manually measure single sti-mulation points at certain DC or pulsed signals as well as transferfunctions by automated sequential tests. The sequential tests allowperforming aging tests.

Software

The software controls thecomplete setup and measu-rement process.

Predefined test setups andtest sequences can be sto-red and retrieved for fasttest preparation. Long termtesting or sequential testingwith various parameters isperformed with the test sequence engineof TestMaster®, a dedicated softwareproduct for testing of semiconductors orcomplete electronic assemblies.

The software is based on LabVIEWTM fromNational Instruments and supplies an easyto use graphical user interface with manyoptions to parametrize individual testsetups.

The optical and electrical units of the tes-ter are delivered factory pre-calibrated.Calibration models allow calibrating theoptical signals on demand with an exter-nal photometer. The opportunity is givento perform a relative or an absolute cali-bration for each individual device.

Test adapter and measurement electronicshardware rack of the IIVVLL TTeesstt PPllaattffoorrmm

above: Comparison measurements in DC and pulsed mode give the same results. Reverse results differ because of the RC-behaviour of the sample design.

Measurement of single or multi-pixel devices can be realized by amodular switching concept.

Acquired data can be stored within ASCII files or in a database sys-tem to allow the correlation of different measurements. Each testcan produce a customized report sheet, which covers the productdata as well as the test results in alphanumeric and graphical form.

Standard System Characteristics

Mechanical System Characteristics:Maximum test sampledimensions: 300mm x 400 mm x 20mmTest contacts: standard: maximum 192

customized: no limits

Electrical System Characteristics:Stimulation: voltage 2-100 V, if resistance >> 1 kΩΩ

(1-50V) (50 ΩΩ);device dependant current (AC/DC): 0-2 A

Luminance: 1 cd/m2 to 200000 cd/m2

Currentmeasurement range: 0,1 µA - 1 A

Highlights:Wide luminance dynamic rangeVarious contact pins in size and number availableCustomized test adapterFlexible test- and measurement software

Options:Contact checkCurrent control: 20 mA-1 A (5o ΩΩ)Calibration equipmentDC-measurement option (±2V)Database connecting to local or customized DBPneumatic adapter for automated tests

PP RR OO DD UU CC TT SS

Science & EngineeringApplications DatentechnikGmbH

Linder HöheD-51147 Köln

Phone: +49 - 22 03 / 9 80 07 - 0Fax: +49 - 22 03 / 9 80 07 - 14

Web: www.sea-gmbh.comMail: info@sea-gmbh.com

Product and company names listed are trademarks or tradenames of their respective companies. August 2006

Science & EngineeringApplications DatentechnikGmbH

industrially approved

customized system

turnkey solution

high performance

reproducable test results

wide dynamic range for tests of nearly allsemiconductors

high performance test adapter with changeablesample holder for device specific adptation

Performance

View

The software of the IVL Test Platform is based on the TestMastersuite, a solution proven in numerous industrial production and R&Dtesting applications. The system is suitable for testing of diverse (O)LED materials used in today's display production. Complete sys-tems for production tests of (O)LED display devices are available.

Apart from the basic TestMaster and other test platforms, our rangecomprises the SpaceMaster system for fiber optics and theMeasureMaster for audio and video testing and analysis.

Consulting & Service

S.E.A. has been a successful provider of system integration solu-tions in measurement and automation technology for more than adecade. You can benefit from this experience by requesting ouradvice. Our services range from the customization of our test solu-tions to the development and integration of turnkey systems.

S.E.A. has expertise in optical measurements and vision inspectionsystems. Please ask our experts - they will be glad to submit a pro-posal addressing your specific testing needs.

PC based IIVVLL TTeesstt PPllaattffoorrmm with testadapter, 19” rack, including pulsegenerator, meter, multiplexer, stimu-lation, and measurement electronics

IVL Test PlatformTest System for Current-Voltage-Luminance Characteristics