Project Report for Materials Informatics
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In-situ X Ray Characterization of Semicrystalline Polymer Microstructure during Deformation 1 ~1nm ~100nm Time Resolved Measurements at Synchrotron Sources
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Transcript of Project Report for Materials Informatics
In-situ X Ray Characterization of Semicrystalline Polymer Microstructure during Deformation
1
~1nm
~100nm
Time Resolved Measurements at Synchrotron Sources
Convert to Real Space
SAXS Analysis
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0.046 A-1
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SAXS Pattern Structural ModelImage Analysis
WAXS Pattern Structural ModelImage Analysis
Project Outline
• Spatial Correlations For Single Time Step
• Phase Recovery Algorithm To Generate Eigen Microstructure
• Establish And Visualize Low Dimensional Representation Of Process-Structure Linkage
• Attempt To Utilize Work Flow To Capture Orientation Information
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