Project Report for Materials Informatics

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In-situ X Ray Characterization of Semicrystalline Polymer Microstructure during Deformation 1 ~1nm ~100nm Time Resolved Measurements at Synchrotron Sources

Transcript of Project Report for Materials Informatics

In-situ X Ray Characterization of Semicrystalline Polymer Microstructure during Deformation

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~1nm

~100nm

Time Resolved Measurements at Synchrotron Sources

Small Angle X Ray Scattering (SAXS)

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Convert to Real Space

SAXS Analysis

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0.046 A-1

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SAXS Pattern Structural ModelImage Analysis

WAXS Pattern Structural ModelImage Analysis

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Model Validation for SAXS via 2D FFT

Project Outline

• Spatial Correlations For Single Time Step

• Phase Recovery Algorithm To Generate Eigen Microstructure

• Establish And Visualize Low Dimensional Representation Of Process-Structure Linkage

• Attempt To Utilize Work Flow To Capture Orientation Information

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Thanks! !

!

David Brough Abhiram Kannan