FQP5N60C / FQPF5N60C · 2019. 10. 13. · December 2013 Thermal Characteristics FQP5N60C /...

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December 2013 Thermal Characteristics FQP5N60C / FQPF5N60C N-Channel QFET ® MOSFET 600 V, 4.5 A, 2.5 Ω Description ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1 www.fairchildsemi.com 1 FQP5N60C / FQPF5N60C — N-Channel QFET ® MOSFET This N-Channel enhancement mode power MOSFET is produced using Fairchild Semiconductor’s proprietary planar stripe and DMOS technology. This advanced MOSFET technology has been especially tailored to reduce on-state resistance, and to provide superior switching performance and high avalanche energy strength. These devices are suitable for switched mode power supplies, active power factor correction (PFC), and electronic lamp ballasts. Features 4.5 A, 600 V, R DS(on) = 2.5 (Max.) @ V GS = 10 V, I D = 2.25 A Low Gate Charge (Typ. 15 nC) Low Crss (Typ. 6.5 pF) 100% Avalanche Tested Absolute Maximum Ratings T C = 25°C unless otherwise noted. Symbol Parameter FQP5N60C FQPF5N60C Unit R θJC Thermal Resistance, Junction-to-Case, Max. 1.25 3.79 °C/W R θCS Thermal Resistance, Case-to-Sink Typ, Max. 0.5 -- °C/W R θJA Thermal Resistance, Junction-to-Ambient, Max. 62.5 62.5 °C/W TO-220 G D S TO-220F G D S G S D * Drain current limited by maximum junction temperature. Symbol Parameter FQP5N60C FQPF5N60C Unit V DSS Drain-Source Voltage 600 V I D Drain Current - Continuous (T C = 25°C) 4.5 4.5 * A - Continuous (T C = 100°C) 2.6 2.6 * A I DM Drain Current - Pulsed (Note 1) 18 18 * A V GSS Gate-Source Voltage ± 30 V E AS Single Pulsed Avalanche Energy (Note 2) 210 mJ I AR Avalanche Current (Note 1) 4.5 A E AR Repetitive Avalanche Energy (Note 1) 10 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns P D Power Dissipation (T C = 25°C) 100 33 W - Derate above 25°C 0.8 0.26 W/°C T J , T STG Operating and Storage Temperature Range -55 to +150 °C T L Maximum Lead Temperature for Soldering, 1/8" from Case for 5 Seconds 300 °C

Transcript of FQP5N60C / FQPF5N60C · 2019. 10. 13. · December 2013 Thermal Characteristics FQP5N60C /...

  • December 2013

    Thermal Characteristics

    FQP5N60C / FQPF5N60CN-Channel QFET® MOSFET600 V, 4.5 A, 2.5 Ω

    Description

    ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com1

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

    This N-Channel enhancement mode power MOSFET is produced using Fairchild Semiconductor’s proprietary planar stripe and DMOS technology. This advanced MOSFET technology has been especially tailored to reduce on-state resistance, and to provide superior switching performance and high avalanche energy strength. These devices are suitable for switched mode power supplies, active power factor correction (PFC), and electronic lamp ballasts.

    Features• 4.5 A, 600 V, RDS(on) = 2.5 Ω (Max.) @ VGS = 10 V,

    ID = 2.25 A

    • Low Gate Charge (Typ. 15 nC)

    • Low Crss (Typ. 6.5 pF)

    • 100% Avalanche Tested

    Absolute Maximum Ratings TC = 25°C unless otherwise noted.

    Symbol Parameter FQP5N60C FQPF5N60C UnitRθJC Thermal Resistance, Junction-to-Case, Max. 1.25 3.79 °C/WRθCS Thermal Resistance, Case-to-Sink Typ, Max. 0.5 -- °C/WRθJA Thermal Resistance, Junction-to-Ambient, Max. 62.5 62.5 °C/W

    TO-220GDS TO-220F

    GDS

    G

    S

    D

    * Drain current limited by maximum junction temperature.

    Symbol Parameter FQP5N60C FQPF5N60C UnitVDSS Drain-Source Voltage 600 VID Drain Current - Continuous (TC = 25°C) 4.5 4.5 * A

    - Continuous (TC = 100°C) 2.6 2.6 * AIDM Drain Current - Pulsed (Note 1) 18 18 * AVGSS Gate-Source Voltage ± 30 VEAS Single Pulsed Avalanche Energy (Note 2) 210 mJIAR Avalanche Current (Note 1) 4.5 AEAR Repetitive Avalanche Energy (Note 1) 10 mJdv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/nsPD Power Dissipation (TC = 25°C) 100 33 W

    - Derate above 25°C 0.8 0.26 W/°CTJ, TSTG Operating and Storage Temperature Range -55 to +150 °C

    TLMaximum Lead Temperature for Soldering, 1/8" from Case for 5 Seconds

    300 °C

  • Package Marking and Ordering Information

    ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com2

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

    Electrical Characteristics TC = 25°C unless otherwise noted.

    Part Number Top Mark Package Reel Size Tape Width QuantityFQP5N60CFQP5N60C TO-220 N/A N/A 50 units

    Packing MethodTube

    TO-220F Tube N/A N/A 50 unitsFQPF5N60CFQPF5N60C

    Notes:1. Repetitive rating : pulse-width limited by maximum junction temperature.2. L = 18.9 mH, IAS = 4.5 A, VDD = 50 V, RG = 25 Ω, starting TJ = 25°C.3. ISD ≤ 4.5 A, di/dt ≤ 200 A/µs , VDD ≤ BVDSS, starting TJ = 25°C.4. Essentially independent of operating temperature.

    Symbol Parameter Test Conditions Min. Typ. Max. Unit

    Off CharacteristicsBVDSS Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA 600 -- -- V∆BVDSS / ∆TJ

    Breakdown Voltage Temperature Coefficient

    ID = 250 µA, Referenced to 25°C -- 0.6 -- V/°C

    IDSS Zero Gate Voltage Drain CurrentVDS = 600 V, VGS = 0 V -- -- 1 µAVDS = 480 V, TC = 125°C -- -- 10 µA

    IGSSF Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V -- -- 100 nAIGSSR Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V -- -- -100 nA

    On Characteristics VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 µA 2.0 -- 4.0 VRDS(on) Static Drain-Source

    On-ResistanceVGS = 10 V, ID = 2.25 A -- 2.0 2.5 Ω

    gFS Forward Transconductance VDS = 40 V, ID = 2.25 A -- 4.7 -- S

    Dynamic CharacteristicsCiss Input Capacitance VDS = 25 V, VGS = 0 V,

    f = 1.0 MHz

    -- 515 670 pFCoss Output Capacitance -- 55 72 pFCrss Reverse Transfer Capacitance -- 6.5 8.5 pF

    Switching Characteristics td(on) Turn-On Delay Time VDD = 300 V, ID = 4.5

    A, RG = 25 Ω

    (Note 4)

    -- 10 30 nstr Turn-On Rise Time -- 42 90 nstd(off) Turn-Off Delay Time -- 38 85 nstf Turn-Off Fall Time -- 46 100 nsQg Total Gate Charge VDS = 480 V, ID = 4.5 A,

    VGS = 10 V (Note 4)

    -- 15 19 nCQgs Gate-Source Charge -- 2.5 -- nCQgd Gate-Drain Charge -- 6.6 -- nC

    Drain-Source Diode Characteristics and Maximum RatingsIS Maximum Continuous Drain-Source Diode Forward Current -- -- 4.5 AISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 18 AVSD Drain-Source Diode Forward Voltage VGS = 0 V, IS = 4.5 A -- -- 1.4 Vtrr Reverse Recovery Time VGS = 0 V, IS = 4.5 A,

    dIF / dt = 100 A/µs -- 300 -- ns

    Qrr Reverse Recovery Charge -- 2.2 -- µC

  • ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com3

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

    � !�����������������

    0.2 0.4 0.6 0.8 1.0 1.2 1.410-1

    100

    101

    150℃

    ※ Notes :1. VGS = 0V2. 250μs Pulse Test

    25℃I DR, R

    ever

    se D

    rain

    Cur

    rent

    [A]

    VSD, Source-Drain voltage [V]

    0 4 12 160

    2

    4

    6

    8

    10

    12

    VDS = 300V

    VDS = 120V

    VDS = 480V

    ※ Note : ID = 4.5A

    V GS, G

    ate-

    Sour

    ce V

    olta

    ge [V

    ]

    8

    QG, Total Gate Charge [nC]

    0 2 4 86 100

    1

    2

    3

    4

    5

    6

    VGS = 20V

    VGS = 10V

    ※ Note : TJ = 25℃

    RDS

    (ON)

    [Ω],

    Drai

    n-So

    urce

    On-

    Resis

    tanc

    e

    ID, Drain Current [A]

    Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics

    Figure 3. On-Resistance Variation vsDrain Current and Gate Voltage

    Figure 4. Body Diode Forward Voltage Variation with Source Current

    and Temperature

    Figure 2. Transfer CharacteristicsFigure 1. On-Region Characteristics

    10-1 0 1010

    200

    400

    600

    800

    1000Ciss = Cgs + Cgd (Cds = shorted)Coss = Cds + CgdCrss = Cgd

    ※ Notes ; 1. VGS = 0 V 2. f = 1 MHz

    Crss

    Coss

    Ciss

    Capa

    citan

    ce [p

    F]

    10

    VDS, Drain-Source Voltage [V]

    10-1 0 10110-2

    10-1

    100

    101 VGS

    Top : 15.0 V 10.0 V

    8.0 V 7.0 V 6.5 V 6.0 V 5.5 V 5.0 V

    Bottom : 4.5 V

    ※ Notes :1. 250μ s Pulse Test2. TC = 25℃

    I D, D

    rain

    Cur

    rent

    [A]

    10

    VDS, Drain-Source Voltage [V]

    842 1010-1

    100

    101

    150oC

    25oC

    -55oC

    ※ Notes : 1. VDS = 40V2. 250μ s Pulse Test

    I D, D

    rain

    Cur

    rent

    [A]

    6

    VGS, Gate-Source Voltage [V]

  • ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com4

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

    Typical Characteristics (Continued)

    100 101 102 10310-2

    10-1

    100

    101

    100 ms

    10 µs

    DC

    10 ms

    1 ms

    100 µs

    Operation in This Area is Limited by R DS(on)

    ※ Notes :

    1. TC = 25 oC

    2. TJ = 150 oC

    3. Single Pulse

    I D, D

    rain

    Curre

    nt [A

    ]

    VDS, Drain-Source Voltage [V]

    100 101 102 10310-2

    10-1

    100

    101

    100 msDC

    10 ms

    1 ms

    100 µs

    Operation in This Area is Limited by R DS(on)

    ※ Notes :

    1. TC = 25 oC

    2. TJ = 150 oC

    3. Single Pulse

    I D, D

    rain

    Curre

    nt [A

    ]

    VDS, Drain-Source Voltage [V]

    Figure 9-1. Maximum Safe Operating Areafor FQP5N60C

    Figure 10. Maximum Drain Currentvs Case Temperature

    Figure 7. Breakdown Voltage Variationvs Temperature

    Figure 8. On-Resistance Variationvs Temperature

    Figure 9-2. Maximum Safe Operating Areafor FQPF5N60C

    25 50 75 100 125 1500

    1

    2

    3

    4

    5

    I D, D

    rain

    Cur

    rent

    [A]

    TC, Case Temperature [℃]

    -100 -50 0 50 100 150 2000.8

    0.9

    1.0

    1.1

    1.2

    ※ Notes : 1. VGS = 0 V 2. ID = 250 μA

    BVDS

    S, (

    Norm

    alize

    d)Dr

    ain-S

    ourc

    e Br

    eakd

    own

    Volta

    ge

    TJ, Junction Temperature [oC]

    -100 -50 0 50 100 150 2000.0

    0.5

    1.0

    1.5

    2.0

    2.5

    3.0

    ※ Notes : 1. VGS = 10 V 2. ID = 2.25 A

    RDS

    (ON)

    , (No

    rmali

    zed)

    Drain

    -Sou

    rce

    On-

    Resis

    tanc

    e

    TJ, Junction Temperature [oC]

  • ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com5

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

    Typical Characteristics (Continued)

    1 0 -5 1 0 01 0 -4 1 0 -3 1 0 -2 1 0 -1 1 0 11 0 -2

    1 0 -1

    1 0 0

    ※ N o te s : 1 . Z

    θ J C( t) = 3 .7 9 ℃ /W M a x . 2 . D u ty F a c to r , D = t1 / t 2 3 . T J M - T C = P D M * Z θ J C( t)

    s in g le p u ls e

    D = 0 .5

    0 .0 2

    0 .2

    0 .0 5

    0 .1

    0 .0 1

    1 0 -5 1 0 -4 1 0 0 1 0 1

    1 0 -2

    1 0 -1

    1 0 0

    ※ N o te s : 1 . Z θ J C( t ) = 1 .2 5 ℃ /W M a x . 2 . D u ty F a c to r , D = t 1 / t 2

    - 3 . T J M = T C P D M * Z θ J C( t )

    s ein g le p u ls

    D = 0 .5

    0 .0 2

    0 .2

    0 .0 5

    0 .1

    0 .0 1

    1 0 -3 1 0 -2 1 0 -1

    t 1 , S q u a re W a v e P u ls e D u r a t io n [s e c ]

    Figure 11-1. Transient Thermal Response Curve for FQP5N60C

    t 1 , S q u a re W a v e P u ls e D u ra t io n [s e c ]

    Figure 11-2. Transient Thermal Response Curve for FQPF5N60C

    t1

    PDM

    t2

    t1

    PDM

    t2Z JC

    (t), T

    herm

    al R

    espo

    nse

    [oC

    /W]

    Z JC

    (t), T

    herm

    al R

    espo

    nse

    [oC

    /W]

  • Figure 12. Gate Charge Test Circuit & Waveform

    Figure 13. Resistive Switching Test Circuit & Waveforms

    Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms

    VGS

    VDS

    10%

    90%

    td(on) tr

    t on t off

    td(off) tf

    VDD

    10V

    VDSRL

    DUT

    RGVGS

    VGS

    VDS

    10%

    90%

    td(on) tr

    t on t off

    td(off) tf

    VDD

    10V

    VDSRL

    DUT

    RGVGS

    VGS

    Charge

    VGS

    10VQg

    Qgs Qgd

    3mA

    VGS

    DUT

    VDS

    300nF

    50KΩ

    200nF12V

    Same Typeas DUT

    Charge

    VGS

    10VQg

    Qgs Qgd

    3mA

    VGS

    DUT

    VDS

    300nF

    50KΩ

    200nF12V

    Same Typeas DUT

    EAS = L IAS2----21 --------------------

    BVDSS - VDD

    BVDSS

    VDD

    VDS

    BVDSS

    t p

    VDD

    IAS

    VDS (t)

    ID (t)

    Time

    10V DUT

    RG

    L

    I D

    t p

    EAS = L IAS2----21EAS = L IAS2----21----21 --------------------

    BVDSS - VDD

    BVDSS

    VDD

    VDS

    BVDSS

    t p

    VDD

    IAS

    VDS (t)

    ID (t)

    Time

    10V DUT

    RG

    LL

    I DI D

    t p

    VGSVGS

    IG = const.

    ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com6

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

  • Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms

    DUT

    VDS

    +

    _

    DriverRG

    Same Type as DUT

    VGS • dv/dt controlled by RG• ISD controlled by pulse period

    VDD

    LI SD

    10VVGS

    ( Driver )

    I SD( DUT )

    VDS( DUT )

    VDD

    Body DiodeForward Voltage Drop

    VSD

    IFM , Body Diode Forward Current

    Body Diode Reverse Current

    IRM

    Body Diode Recovery dv/dt

    di/dt

    D =Gate Pulse WidthGate Pulse Period

    --------------------------

    DUT

    VDS

    +

    _

    DriverRG

    Same Type as DUT

    VGS • dv/dt controlled by RG• ISD controlled by pulse period

    VDD

    LLI SD

    10VVGS

    ( Driver )

    I SD( DUT )

    VDS( DUT )

    VDD

    Body DiodeForward Voltage Drop

    VSD

    IFM , Body Diode Forward Current

    Body Diode Reverse Current

    IRM

    Body Diode Recovery dv/dt

    di/dt

    D =Gate Pulse WidthGate Pulse Period

    --------------------------D =Gate Pulse WidthGate Pulse Period

    --------------------------

    ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com7

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

  • www.fairchildsemi.com8

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

    Mechanical Dimensions

    ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    Figure 16. TO-220, Molded, 3-Lead, Jedec Variation ABPackage drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-ically the warranty therein, which covers Fairchild products.

    Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:

    http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT220-003

  • ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com9

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

    Mechanical Dimensions

    Figure 17. TO220, Molded, 3-Lead, Full Pack, EIAJ SC91, Straight LeadPackage drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-ically the warranty therein, which covers Fairchild products.

    Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:

    http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TF220-003

  • ©2003 Fairchild Semiconductor Corporation FQP5N60C / FQPF5N60C Rev. C1

    www.fairchildsemi.com10

    TRADEMARKSThe following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.

    *Trademarks of System General Corporation, used under license by Fairchild Semiconductor.

    DISCLAIMERFAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.

    LIFE SUPPORT POLICYFAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.As used here in:1. Life support devices or systems are devices or systems which, (a) are

    intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.

    2. A critical component in any component of a life support, device, orsystem whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety oreffectiveness.

    PRODUCT STATUS DEFINITIONSDefinition of Terms

    AccuPower™AX-CAP®*BitSiC™Build it Now™CorePLUS™CorePOWER™CROSSVOLT™CTL™Current Transfer Logic™DEUXPEED®Dual Cool™EcoSPARK®EfficentMax™ESBC™

    Fairchild®Fairchild Semiconductor®FACT Quiet Series™FACT®FAST®FastvCore™FETBench™FPS™

    F-PFS™FRFET®Global Power ResourceSMGreenBridge™Green FPS™Green FPS™ e-Series™Gmax™GTO™IntelliMAX™ISOPLANAR™Marking Small Speakers Sound Louder and Better™MegaBuck™MICROCOUPLER™MicroFET™MicroPak™MicroPak2™MillerDrive™MotionMax™mWSaver®OptoHiT™OPTOLOGIC®OPTOPLANAR®

    PowerTrench®PowerXS™Programmable Active Droop™QFET®QS™Quiet Series™RapidConfigure™

    Saving our world, 1mW/W/kW at a time™SignalWise™SmartMax™SMART START™Solutions for Your Success™SPM®STEALTH™SuperFET®SuperSOT™-3SuperSOT™-6SuperSOT™-8SupreMOS®SyncFET™

    Sync-Lock™®*

    TinyBoost®TinyBuck®TinyCalc™TinyLogic®TINYOPTO™TinyPower™TinyPWM™TinyWire™TranSiC™TriFault Detect™TRUECURRENT®*SerDes™

    UHC®Ultra FRFET™UniFET™VCX™VisualMax™VoltagePlus™XS™

    ®

    Datasheet Identification Product Status Definition

    Advance Information Formative / In Design Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.

    Preliminary First ProductionDatasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.

    No Identification Needed Full Production Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.

    Obsolete Not In Production Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.

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    Rev. I66

    tm

    ®

    FQP5N

    60C / FQ

    PF5N60C

    — N

    -Channel Q

    FET® M

    OSFET

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