X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator...

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X-ray Residual Stress Analyzer Create New Value Create New Value Create New Value Create New Value ・Typically『90secs /point measurement』 for Ferritic samples. ・『360°』FWHM, retained austenite measurement ・Truly portable x- ray analyzer

Transcript of X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator...

Page 1: X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator ②Measurement Once measurement point the is fixed, move the sensor unit and measure.

X-ray Residual Stress Analyzer

Create New ValueCreate New ValueCreate New ValueCreate New Value

・Typically『90secs /point measurement』 for Ferritic samples.

・『360°』FWHM, retained austenite measurement

・Truly portable x-ray analyzer

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μ-X360: Standard System

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Sensor UnitApprox.5kg(11lbs)Not include height stage

Power supply unitApprox. 6kg(13.2lbs)

PC(USB port)

Outline specification

X-ray Tube : Standard Cr ・30kV・1mA

Collimator size : Φ1.0mm(φ0.04inch)

(Illuminated surface Approx. Φ2mm(0.08inch))

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μ-X360: Sensor Unit

Uses a single incident angle measurement『cosα method』

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μ-X360: Safety Cabinet:Standard Set

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・Standard Safety cabinet

Material : Polyvinyl chloride /thickness [inch]

D/W/H : 24/24/32[inch]

Weight : 75[lbs](Only safety cabinet)

Sensor unit&Z height stage& Safety cabinet

Power supply unit (Emergency switch&Warning light

PCApplication

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Compact & Portable for ‘On-site’ Analysis

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Sensor unit4.0kg(8.8lbs)

Tripod & ArmApprox.10kg(22lbs)

Battery2.5 kg(5.5lbs)

Typical battery power operation: 6 hours life enabling around 100 individual point measurements

Main power supply

Control PC

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μ-X360 Key features

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●Easy setup - Sample position tolerance ±5mm

(in-built marker & CCD camera to assist the sample positioning)

�Fast – 90 secs / measurement (typical)

�Reliable - Acquires the complete Debye diffraction rings

(Data reveals: grain orientation (texture) & grain coarsening, etc.)

�Low price - Around 50% less than alternative systems.

�On site analysis - Made practical due to the compactness, light-weight and ease of setting up at sample’s location

�Accuracy - The 2D detector captures the complete Debye rings; which improves the measurement accuracy of multiple data acquisitions

�Eco & Safe - High sensitivity of detector requires low power

X-rays emission

�Compact & light - The 5 kg(11lbs) sensor unit is easily setup on a tripod or arm on-site

�Low electric power - Only 75W during measurement

and 30W in standby mode. (battery power available)

Page 7: X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator ②Measurement Once measurement point the is fixed, move the sensor unit and measure.

What is stress analysis by XRD?

Tensile

Compressive

Shot(small spherical media)

External force

Materials try to restore its original shape, thereby, compressive stress generates.

Steel material

When external force applied

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Deformation

Tensile → Compressive

Compressive

Residual stresses remain in the material after all external loads are removed.

『Residual stress measurement by XRD』is one of the non-destructive measurement methods.

Residual stresses are often generated from processes such as Grinding, Machining, Welding, Shot Peening and Surface treatment.

External force

Possible to evaluate the stress condition within the surface regions by X-ray diffraction.

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About X-ray diffraction

• Bragg’s law

n (an integer) is the "order" of reflection, λ is the wavelength of the incident X-rays, d is the interplanar spacing of the crystal and θ is the angle of incidence that equals the angle of scattering (diffraction angle).

Bragg’s law (Diffraction the x-ray scattering from plane of lattice that satisfy the Bragg

conditions.)

θλ 2dsinn =

A

B

C

E

D

θ

d

θ

λ

(hkl)

(hkl)

O

O’

P

P’

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Bragg’s Condition

Incident X-ray Incident X-ray

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Crystal grains of polycrystalline material

• Crystal grains of polycrystalline material such as Iron (Fe)

Crystal grains of polycrystalline material such as iron have various orientations. X-rays reflected from various orientations of crystal grains because x-ray illuminated spot size is much bigger than the average crystal grain.

Crystal grain of different orientation

Sample surface

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X-Ray Diffraction from polycrystalline material

• Illuminating polycrystalline material with X-rays

X-ray diffraction occurs from the various orientation of the grain crystals that satisfy Bragg’s law. The diffracted X-ray form as a cone around the incident x-ray axis because of the variation in crystal’s orientation.

Sample surface

Incident X-ray

Diffracted X-

ray

Debye ring

Incident X-ray

Sample

Crystal grain

(lattice)

Diffracted X-ray

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The Sin2ψ Method

• Outline of sin2ψ methodIn the sin2ψ method the variation of the lattice interplanar distance is detected by changing the angle of incident X-rays (ψ0). (In the standard XRD measurement, 7 different angular measurement is recommended.)

0or1D

Detector

PSPC,

etc

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Z

X-ray incident angle

Diffracted

X-ray

ε(Strain)

Diffracted face sample

ψ0

ψ

η

η

Scan direction

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The Sin2ψ Measurement MethodXray(ψ00)

Strain(40)

Strain(20)

Strain(0)

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The Sin2ψ Measurement MethodXray(ψ00)

When the stress is applied

When the stress is applied, X-ray incident angle ψ0 is large,Compressive stress apply ����strain’s change results���� d become smaller ���� θ increases nλ=2dsinθ

Calculate the stress from the change of diffraction normal angle ψ.

Strain(40)

Strain(20)

Strain(0)

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Calculation of sin2ψ Method

There is a linear relationship exhibited when plotting strain angle (deg) on the vertical axis , and sin2ψ on horizontal axis. The slope gives the stress value; this is the basis of the sin2ψ method.

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This slope is stress.

On the assumption that the stress condition is on plane surface, stress σx is calculated from the following formula.

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Acquire full Debye-Scherrer ring; by a single short duration X-ray exposure. Determination of the residual stress achieved by accurately measuring the position of the Debye-Scherrer rings; their positions are a direct measure of strain.

The Cos α Method (µ-X360)

• Outline of the cosα method

Diffracted X-ray

ε(Strain)

Diffracted face Sample

ψ0

ψ

η

η

Incident angle

Debye ring

Zαααα

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Principal of the Cosα Method

X-ray

2D detector

Debye-Scherrer ring

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Principal of the Cosα Method

Incident X-rays

2D detector

Debye-Scherrer

When stress is applied

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Green face -

the lattice planes are orientated close to the stress direction and the crystal lattice

spacing become smaller in response to the applied stress, therefore θ increases.

Blue face -

the lattice planes are orientated close the direction parallel to the stress direction. The

interval of the crystal lattice increases (Poison’s ratio) crystal lattice spacing increases

and θ becomes smaller.

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The Cosα Calculation Formulae

• Residual stress calculation (σ) by the Cosα method

Acquire the full Debye-Sherrer ring. The magnitude of strain is determined from the detected position of the Debye-Scherrer ring. Calculate using the following formula.

)}( ){(2

1 1 απααπαα εεεεε −−+= -+-

+−=

α

εα

ψηνσ

cossin2

1

sin2

1

1

1

0

・・・

Ex

Elastic constant K Slope M

)}( ){(2

1 2 απααπαα εεεεε −−+= ---

÷

+=

α

εα

ψηντ

inssin

1

sin2

1E 2

0

xy ・・・

)1(2

αααα

εα

επ-αεπ+α

ε-α

Page 19: X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator ②Measurement Once measurement point the is fixed, move the sensor unit and measure.

The Cos α Method

Horizontal axis is cos α [α is the Azimuth angle of Debye-Sherrer ring], vertial axis is εα1 calculated using the formulae in the previous slide. As with the sin2ψ method, the slope of the line gives the stress value.

This is the cos α method.

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This slope is stress.

(cosα line)

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The Cos α & Sin2ψ Methods compared

Comparison between the Sin2ψ and Cos α techniques – the Cos αrequires only a single angular measurement for complete analysis .

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Sin2ψ technique (existing)

(Multi-positions of

detector)

COS α technique (μ-X360)

(Single position of detector)

diffraction surface

Diffracted X-ray

ε (strain)

sample

ψ0

ψ

η

η

X-ray beam

Debye ring

Z

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Detector(PSPC)

diffraction surface

Z

X-ray beam

diffracted X-ray

ε (strain)

sample

ψ0

ψ

η

η

scan

R**(Japan)

S**(Finland)

B**(Germany)

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Comparison between Sin2ψ & Cos α Methods

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Sin2ψ method

(Conventional)

Cos α method

(μ-X360)

X-ray tube 40 kV & 40 mA (typical)

△ 30 kV & 1 mA

(Safety & Ecology)

X-ray detector Point, 1D and part 2D △ Full 2 D

(visual analysis)

Precision mech. Mandatory × Not necessary 〇

Data 5-7point △ Max 125 point

(Debye-Scherrer ring)

Permissible

range

±50 µm

(complicated setting)

× ±5 mm

(easy setting)

Measurement time 5-20 min. △ 90 sec. 〇

Cost 250,000 (USD) × 125,000 (USD) 〇

FWHM repeatability △ ◎

On-site × ◎

Portable Water cooling & Goniometer stage

△ Air cooling,

Goniometer not required

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Application Software – key points to making a measurement

� Procedure

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Sample positioning

(Captured by CCD camera)

Measurement

(X-ray incidence & detection)

Data output

(Residual stress & FWHM)

①Display diffraction ring, residual stress

②Measurement log : easy and fast to retrieve past data

③Captured by the CCD camera : confirms sample position and recorded image stored for future reference

① ②

Calculation

(Residual stress)

Residual stress

FWHM

[-] compressive

[+] tensile

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μ-X360 Various Analysis Images

・Display the various Debye-Scherrer rings

・Display the diagram of residual stress & FWHM

2D Debye ring

3D Debye ring Peak position

2D development 3D development Profile

cosαline[max125point]

Calculate the stress from the slope

■μ-X360’s results

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Advantage of the Full 2D detection

■Advantage 2D Full data of Debye-Scherrer ring (500 points)

→High repeatability and reliability because of max. 500 points data

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①Debye-Scherrer ring

2D sensor intensity distribution

③Cos α line

125points

②Result (Example)

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A key advantage of the Full 2D detection –immediate results

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Grain coarsening

e.g. Bead on Plate of stainless steel weld

Grain orientation

(texture)

e.g. Influence of rolling direction

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Standard Type and Narrow space Type

■µ-X360 [Standard]

■µ-X360n [Narrow space]

Suitable for measuring in narrow spaces such as fillet welding joints.

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μ-X360n: Narrow Space Type

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Outline specification

Tube : Standard Cr ・30kV・1mA

Collimator size : Φ1.0mm(φ0.04inch)

(Illuminated surface Approx. Φ2mm(φ0.08inch))

Sensor unitApprox.4kg(8.8lbs)(Z height stage)

Power supply unitApprox.6kg(13.2lbs)

PC(USB)

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μ-X360n Narrow Space Measurement

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センサユニット4.0kg

Standard measurement

*Possible to measure fillet welded joints.

µ-X360n

ψ

ψ

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① Safety Cabinet (Optional)

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0.2inch thickness polyvinyl chloride safety cabinet can protect against radiation leakage.Possible to design the customized safety cabinet.

Standard safety cabinet24×24×32inch:25kg(55lbs) Door open

Customized safety cabinet

Doors opened

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② Accessories

Possible to design the customized accessories.Create New ValueCreate New ValueCreate New ValueCreate New Value

Height adjustment stand

Tripod stand+Flexible arm Wall surface measurement

Flexible arm +XY stage

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③Retained Austenite Analysis

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Displays the percentage of the retained austenite that has not transformed even at ambient temperature.

α211 γ220

341.28 deg.341.28 deg.

272.16 deg.

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④X & Y Stage – stress mapping

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*2 axis stage(X/Y) + Application software

■Stress mapping by controlling X & Y axis stage.『Stress mapping come true.』

Mapping result

Weld bead

□Measure 25mm(1inch) by 1mm(0.04inch)Step.26p×26p=676point

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⑤Electropolishing(Under development)

①Top part(electropolishing part)

It takes 5 mins to electropolish □7mm size to 100um depth

*This image may be different from actual product because it is

under development.

② Controller weight :Approx. 3lbsSize:WHD:7 /2.7/

10.2inch

③Electropolishing liquid:TBD

Fixing tool

Electrode part

Electropolishing machine, µ-X360 & µ-X360n Accessories

Current control and Timer function

Electropolishing part

Controller unit

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⑥Positioning tool using a Microscope (under development)

①Position setting

Sample setting by checking through microscope

Angle setting by angular auto-collimator

② Measurement

Once measurement point the is fixed, move the

sensor unit and measure.

Microscope

30x

Auto-collimator

Single axis stage

Sensor move

Optional items to improve the positioning accuracy

Positioning accuracy:50µm

Sample stage

*This image may be different from actual product because

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Page 35: X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator ②Measurement Once measurement point the is fixed, move the sensor unit and measure.

Measurement Example:Automobile parts

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①Gear②Wheel③Crankshaft④Exhaust manifold⑤Suspension⑥Bearing⑦Conrod⑧Chassis➈Screw⑩Ball screw⑪Muffler

カセット溶接HAZ部測定

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Page 36: X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator ②Measurement Once measurement point the is fixed, move the sensor unit and measure.

Measurement Example : Shot-Peening

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①Before shotpeening-141MPa ②After shotpeening -459MPa

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Page 37: X-ray Residual Stress Analyzer - Products4Engineers · Angle setting by angular auto-collimator ②Measurement Once measurement point the is fixed, move the sensor unit and measure.

Measurement Example:On-site measurements

■Plant maintenanceWelds&Shot-peening effect

Check aging degradation

■TankWelds, Tempering effect

■TubeWelds&Heat treatment

Weld bead

Weld bead

Weld bead

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Measurement Example: On-site measurements

①Railway

②Road construction

③Water plant

④Bridge

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Measurement Example

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①Medical instruments

②Added value product

③Teeth of saw

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Thank you very much for your attention.

In some cases,

additional information is needed, please ask separately!

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Appenx1) Repeatability and Compatibility

100 measurement repeatability and 3 machines compatibility

-800

-700

-600

-500

-400

-300

-200

-100

00 20 40 60 80 100残

留応

力残

留応

力残

留応

力残

留応

力[M

Pa]

回数回数回数回数Number of measurementR

esid

ual

str

ess 【

MP

a】

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Annex 2) Correlation with strain gauge; by 4 point

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Data comparison between “Strain gauge” & “u-X360” using stress-free sample piece. (sample piece : SS400, Gauge : KYOWAKFG-2-120-C1-11L30C2R)

Externalforce

Strain gauge

μ-X360Externalforce

Strain gauge

Strain gauge

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Annex3. Radiation dose leakage operating when using the safety cabinet

5mm thickness polyvinyl chloride safety cabinet can protect against radiation leakage.

Inside the safety cabinet

■Radiation dose leakage0.1µSv/h or less (minimum measure unit

: 0.1µSv/h)

■Survey DosimeterICS-331BV1 (Hitachi-Aloka)

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0.0µSv/h

40mm(1.57inch)

o

o

20mm(0.78inch)

l0.0µSv/h

0.0µSv/h

o

p

m

lp

m

lp

m

X

XX

X

0.0µSv/h

0.0µSv/h

0.0µSv/h

0.0µSv/h

0.0µSv/h

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Annex4. Radiation dose leakage operating without the safety cabinet

Without the shielding cabinete.g. On-site measurements

■Radiation dose leakage0.0uSv/h (@2000mm) (minimum measure unit :0.1uSv/h)

■Survey DosimeterICS-331BV1 (Hitachi-Aloka)

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1000mm(3.9inch)

2000mm(7.8inch)

o

o

0.5uSv/ho

p

m

lp

m

l lp

m

X

XX

X

0.4uSv/h

0.0uSv/h

0.0uSv/h

0.0uSv/h

0.0uSv/h

0.0uSv/h

0.0uSv/h

Operating outside the shielding cabinet, Pulstec has confirmed the radiation dose leakage is 0.0 uSv/h, at a distance of over 2 meters or more.

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Annex4) Correlation with a sin2Ψ based analyzer

y = 1.087 x - 65.319

R² = 0.998

-1600

-1400

-1200

-1000

-800

-600

-400

-200

0

-1600 -1400 -1200 -1000 -800 -600 -400 -200 0

Oth

er

Analy

zer

μ-X360

Correlation

(sample : Ferrous test piece)

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Annex5) Research study FWHM and grain size

Grain size 3〜5um

Grain size 5〜10um

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Annex6) Research study FWHM vs Rockwell Hardness

0

10

20

30

40

50

60

70

0,0 5,0 10,0

HRC

半価幅[度]

HRC vs 半価幅

If the type of the steel is same, the relationship between

HRC (Rockwell ‘C’ scale) and FWHM may be same.

HRC vs FWHM

FWHM (degree)