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Aug 14, 2009 NGC/CSTC, Hamilton, ON 1
Semiconductor Scintillators and Three-Dimensional Integration
• Isotope identification spectroscopic energy resolution
• Direction to source angular resolution
critical needs:
Aug 14, 2009 NGC/CSTC, Hamilton, ON 2
X-ray (γ-ray) attenuation
1 mm
1 cm
1 dm
absorption length
Aug 14, 2009 NGC/CSTC, Hamilton, ON 3
1E-3 0.01 0.1 1 10
0.1
1
10
100
1000
10000
100000
1 mm
Si Ge
CdTe InP
A tte
nu at
io n
C oe
ffi ci
en ts
(c m
-1 )
hν (MeV)
Element Z
Si 14×2
Ga/As 31/33
Ge 32×2
In/P 49/15
Cd/Te 48/52
X-ray (γ-ray) attenuation by materials
Aug 14, 2009 NGC/CSTC, Hamilton, ON 4
Semiconductors and scintillators
Thallium EC
EV
hν
= 3 eVEG
= 7 eV
NaI scintillator
> 200 nS
38,000 ph/MeV
Si or Ge pin
diode
cm
> 100 nS
77K
> 10 kV
up to 300,000 e-h/MeV
p
n
Aug 14, 2009 NGC/CSTC, Hamilton, ON 5
Gamma spectroscopy
One measures the number N of electrons and holes produced by incident gamma particle
N ~ Eγ
That number fluctuates.
If the statistics of N
were Poisson,
var
(N) = N
but due to correlations (in semiconductors)
var
(N) =
F N
the Fano factor, F ≈
0.1
Aug 14, 2009 NGC/CSTC, Hamilton, ON 6
Non-proportionality in scintillators
Luminescence in dielectric scintillators is controlled by reactions nonlinear in N (exciton formation, Auger, etc.)
This is one of the reasons γ
spectroscopy with scintillators is not as accurate as it is with semiconductor (diodes).
In semiconductor scintillators, every reaction on the way to luminescence is linear
in the N
of minority carriers
Expect
no non-proportionality effects!
S. A. Payne et al (LLNL group), preprint, 2009
Need: N ~ Eγ
but ...
Aug 14, 2009 NGC/CSTC, Hamilton, ON 7
3D scintillator array
Semiconductor scintillators, each endowed with its own photoreceiver
10 × 10 × 10 array contemplated
Enables both
isotope discrimination and determination of the direction to source
A different way of determining Eγ
(unlike γ
spectroscopy)
Aug 14, 2009 NGC/CSTC, Hamilton, ON 8
3D pixellation of response to a single γ
photon
Upon analog-to-digital conversion each unit reports not a 1 ns pulse but an information-carrying signal:
• where ionization occurred
• time of the event
• amplitude of the event
Photosensitive Layer
γ
- Sensing
Semiconductor
Scintillator
Stack of Scintillator
Slabs
2D pixel
γ
Aug 14, 2009 NGC/CSTC, Hamilton, ON 9
Compton “telescope”
⎟⎟ ⎠
⎞ ⎜⎜ ⎝
⎛ −+=
10 1
111cos EE
θ
iii
iii
EE EE
−=Δ −+=
−
−− −
1
11 11cosθ
keV) 5112 =cme(in units of
The energy E0
of the incident γ-photon
Compton kinematics: two equations at each interaction site
i
The
incident
direction
⎟⎟ ⎠
⎞ ⎜⎜ ⎝
⎛ − Δ
+Δ+ Δ
+Δ= 2
22 2
2 10 cos1
4 2 1
2 θ E
θ3
θ1
Δ1
θ2
E0
1n̂
0n̂ Δ2
γ
Δ3
Aug 14, 2009 NGC/CSTC, Hamilton, ON 10
What is needed
• Semiconductor scintillator “transparent”
to its own luminescence
• Integrated (optically tight) surface photoreceiver system of slightly smaller bandgap
• Readout ASIC customized to the photoreceiver system
The triad:
I will focus on the first two legs of the triad
Aug 14, 2009 NGC/CSTC, Hamilton, ON 11
Semiconductor scintillator: transparency
• Moss-Burstein shift
• Photon re-absorption suppressed
• Radiative decay time ≈
10−9
s
• Need material transparent to its own fundamental light emission
• Photons must be delivered to the surface
EC
EV
EF
hνInP
“Conventional”
transparency
Aug 14, 2009 NGC/CSTC, Hamilton, ON 12
Need for optically-tight photoreceiver
θ0InP
Air
Total Internal Reflection
escape cone
θ0 =17º
2% for free-space detectorsn n
/1sin 3.3
0 = =
θ
023.02sinsin4 1 02
0
0
≈⎟ ⎠ ⎞⎜
⎝ ⎛=∫ θθϕθπ
θ
dd
escaping fraction of photons
Optically-tight integrated detectors collect the entire scintillating radiation
Epitaxial InGaAsP diodes on InP
Aug 14, 2009 NGC/CSTC, Hamilton, ON 13
Epitaxially integrated pin diode
p+ n –
n+ i
n+
InP wafer
2 μmquaternary InGaAsP
Si3
N4
patterned resist p metal contact
n metal contact backside patterning
epitaxial layers
bare scintillator slab
Sarnoff – SBU collaboration
Aug 14, 2009 NGC/CSTC, Hamilton, ON 14
Characteristics of quaternary epi diodes
(Q) GE
(InP) GE
AE FE
)cm10(for eV 0.23
(designed) eV 1.24300K) (Q; (expt) eV 1)300(
315 F
G
A
−≈=
= ≈
nE
E KE
as determined by CV
profiling both estimate jibe !
IV Characteristics of Diodes at 300 and 77 K
200
400
600
800
1000 1200
1400
1600
1800
2000
‐2 ‐1.5 ‐1 ‐0.5 0 0.5 1 1.5
Voltage (V)
Current (pA) 295 K
77 K
0.56 V
⎟⎟ ⎠
⎞ ⎜⎜ ⎝
⎛ +− ∝
kTm eVTEI
2 )(exp A
< 10 pA
at 300 K (1 pA
in best diodes)
Light collection efficiency ≈
85%
Aug 14, 2009 NGC/CSTC, Hamilton, ON 15
Read-Out Circuits
Output digital readout data
ASIC
IPD
CDET
Peak detector
Preamplifier
Pulse-shapingPhotodetector
ADC
Vss
( ) LKsh MOSm
th2 MOSDET
2 2 3 8ENC qIa
fC Ka
g kTaCC ff τ
τ +⎥
⎦
⎤ ⎢ ⎣
⎡ ⋅
+⋅+=
shot noisethermal noiseENC –
currently: 3 ×
103
Next generation: < 103 ☺
low
ILK
≈
10 pAhigh CDET≈ 50 pF
Presenter Presentation Notes Equivalent Noise Charge (ENC) quantifies sensitivity of the electrical readout circuitry in terms of the charge at the output of the detector that would produce a signal output equal to the total noise contribution.
Aug 14, 2009 NGC/CSTC, Hamilton, ON 16
Single-quanta response
Train of scintillator pulses recorded as voltage waveform in the read-out circuit
α-particles from 241Am
α-particle from 241Am
γ-photon from 137Cs
Aug 14, 2009 NGC/CSTC, Hamilton, ON 17
Making semiconductor transparent
• Moss-Burstein shift Success “mixed”
• Photon recycling Nearly ideal non-transparent scintillator
• Subband luminescence centers E.g., Yb3+ luminescent ion in InP ( 1μm emission)
• Impregnated “guest-host”
structures Non-layered two-phase random systems
... to its own fundamental luminescence
... new ideas are welcome
Aug 14, 2009 NGC/CSTC, Hamilton, ON 18
Transparency: theory vs. reality
EF
EG
Conduction band
Valence band
hν
EC
EV
Momentum non-conservation in heavily-doped InP
“Average”
(over the emission spectrum) photon mean free path is about 0.1 mm
1.3 1.4 1.5 Photon energy (eV)
Emission spectrum
Log Transparency
EF
no free lunch
Aug 14, 2009 NGC/CSTC, Hamilton, ON 19
Luminescence Experiments
Excitation beam
Reflection Luminescence
Transmission Luminescence
Monochromator InP wafer
Monochromator 1.25 1.30 1.35 1.40 1.45 1.50 1.55 1.600.0
0.2
0.4
0.6
0.8
1.0
Transmission Luminescence
Reflection Luminescence
Transm'n Spectrum
hv, eV
300 K
InP, ND
=6.3×1018
cm-3
(S)
Heavily doped n-type InP wafers from Nikko materials (ACROTEC)
1.25 1.30 1.35 1.40 1.45 1.50 1.55 1.60 0.0
0.2
0.4
0.6
0.8
1.0
Trans'n Luminesc.
Reflection Luminescence