Lecture 4: 3D Integrated Circuit Design

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© PSU Summer Course: Summer Course: Advanced Topics in Modern VLSI design Advanced Topics in Modern VLSI design Instructor: Yuan Xie [email protected] http://www.cse.psu.edu/~yuanxie Course website: http://www.cse.psu.edu/~yuanxie/Tsinghua/ Lecture 4: 3D Integrated Circuit Design

Transcript of Lecture 4: 3D Integrated Circuit Design

© PSU

Summer Course: Summer Course: Advanced Topics in Modern VLSI designAdvanced Topics in Modern VLSI design

Instructor: Yuan [email protected]

http://www.cse.psu.edu/~yuanxieCourse website:

http://www.cse.psu.edu/~yuanxie/Tsinghua/

Lecture 4: 3D Integrated Circuit Design

© PSU2现代VLSI设计技术 Lecture 04, 谢源,2006/8

Device Scaling Device Scaling

SCALING:Voltage: V/αOxide: tox /αWire width: W/αGate width: L/αDiffusion: xd /αSubstrate: α * NA

Scaled Device

L/α xd/α

GATEn+ source n+ drain

WIRINGVoltage, V / α

W/α

p substrate, doping α*NA

tox/α

R. Dennard IEEE JSSC, 1974R. Dennard IEEE JSSC, 1974

XjXj XjXj

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Wire ResistanceWire Resistance

L

W

H

R =ρ L

H W

Sheet Resistance RR1 R2=

=

ρ LA

=

5.5 x 10-8Tungsten (W)2.7 x 10-8Aluminum (Al)2.2 x 10-8Gold (Au)1.7 x 10-8Copper (Cu)1.6 x 10-8Silver (Ag)ρ(Ω-m)Material

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Wire ComparisonsWire ComparisonsIntel P856.5Al, 0.25µm

Ω - 0.33 M2

Ω - 0.33 M3

Ω - 0.12 M4

Ω - 1.11 M1

Ω - 0.05 M5

Scale: 2,160 nm

Ω - 0.49 M2

Ω - 0.49 M3

Ω - 0.17 M4

Ω - 1.00 M1

Ω - 0.08 M5

Ω - 0.07 M6

Intel P858Al, 0.18µm IBM CMOS-8S

CU, 0.18µm

Ω - 0.97 M1

Ω - 0.10 M6

Ω - 0.10 M7

Ω - 0.70 M2

Ω - 0.50 M3

Ω - 0.50 M4

Ω - 0.50 M5

From MPR, 2000

© PSU5现代VLSI设计技术 Lecture 04, 谢源,2006/8

ProblemProblem

Courtesy: CadenceCourtesy: Cadence

Interconnects dominate the performance in deep submicron designs

Interconnect + gate delayInterconnect delay

Aluminum

Copper

Gate delay

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Global interconnect does not scaleGlobal interconnect does not scale

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Range of a Wire in One Clock Cycle

0

0.05

0.1

0.15

0.2

0.25

0.3

1995 2000 2005 2010 2015Year

Proc

ess

(mic

rons

)

700 MHz

1.25 GHz

2.1 GHz

6 GHz 10 GHz13.5 GHz

• From the SIA Roadmap

[Challenges for Computer Architects. Breaking the Abstraction Barriers, SamanAmarasinghe]

© PSU9现代VLSI设计技术 Lecture 04, 谢源,2006/8

Solutions for Interconnect Crisis?Solutions for Interconnect Crisis?

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SolutionsSolutionsVarious technologies being actively explored to address the interconnect crisis.

Angular interconnect (X-routing)Optical on-chip interconnect Network-on-chip (intensive research since 2000)Three-dimensional (3D) Integration

© PSU11现代VLSI设计技术 Lecture 04, 谢源,2006/8

What is 3d Integration?

By 2016, Chips will be almost all memory…… 3D circuits will be an established technology… The use of 3D technologies will have a major impact on design and layout

-- Y. Nishi, 6/11/2006

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Vertical (3D) Integration isn’t new!

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Vertical (3D) Integration isn’t new! when real estate became pricey.

Architects built high-rise.

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Device Layer 2Vertical Interconnect

Silicon

1

Multiple layers of active devicesVertical interconnects between layers

Device Layer

Silicon

1

Courtesy: K.Bernstein, IBM

2D Chip

3D Chip

Chip level 3D Integration:

Layer 1

Layer 2

when interconnect becomes priceyComputer Architects may build 3D Microarchitecture!

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Benefits of ThreeBenefits of Three--Dimensional Chip ?Dimensional Chip ?

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Benefits of ThreeBenefits of Three--Dimensional ChipDimensional ChipReduction of global interconnect

L

L

Delay/Power reductionSmaller footprintMix-technology integration

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Interconnect PowerInterconnect PowerInterconnects dominate the power in deep submicron designs

Interconnect consumes 51% of dynamic power!

Source: “Interconnect power dissipation in a microproceesor”,Magen et.al. Intel, SLIP 2004

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How to build 3D Chip: wafer bondingHow to build 3D Chip: wafer bonding

Bulk Si

Burried Si

Burried Si

Bulk Si

Bulk Si

Bulk Si

metal & ILD layers 1active device layer 1

active device layer 2

active device layer 3

Burried Si

Burried Simetal & ILD layers 2

metal & ILD layers 3

Face-to-Back Wafer-Bonding

3D Via0.2μm x 0.2μm ~

10μm x 10μm

IBM Nov. 2002

Tezzaron, 3D 8051 DAC 2005

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3D Research3D Research

Industry Players: IBM, Intel, Tezzaron, Infineon etc.Research Activities:

Active Research on Fabrication/Circuits/FPGA/EDA

(MIT/Stanford/RPI/Cornel/UMN/NCSU/PSU/GIT/UCLA etc.)

Microarchitecture3D Cache design (PSU, GIT, ICCD 05) 3D IA-32 Microprocessor (Intel, ICCD 04)

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ITRSITRS

Source: ITRS roadmap on interconnectSource: ITRS roadmap on interconnect

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NewsNews

Source: ITRS roadmap on interconnectSource: ITRS roadmap on interconnect

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NewsNews

http://www.research.ibm.com/resources/news/20021111_3d_ic.shtml

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Building 3D ICsBuilding 3D ICsBottom-Up Approach

sequential device processingtop layers formed by a Si re-crystallization or epitaxial Sigrowth

Top-Down Approachmultiple layers fabricated by conventional meanslayers assembled to build up 3D IC

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How to build 3D IC (1): wafer bonding How to build 3D IC (1): wafer bonding

(a) SOI approach

(b) Face-to-face

(c) Face-to-back

Integration schemes evaluated by IBM

Source: A. Young, IBM, 2005

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Fabrication TechnologyFabrication Technology

Stacking technologyChip-to-chip contact

Inter-chip contactThrough wafer contact

Face-2-Face Face-2-Back

Inter-chip contact

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IBM IBM ““AssemblyAssembly”” Approach Approach to 3D IC Fabricationto 3D IC Fabrication

Device layers stacked using wafer bondingEach layer fabricated by conventional processes

GLASSGLASS

Circuit Layer 1

Circuit Layer 23D IC

GLASS

Attach circuit to glass handle waferRemove original substrate

Align & bond top circuit to bottom circuit

Remove handle wafer & adhesivesForm vertical interconnects

BOX

SOI

Source: A. Young, IBM, 2005

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How to build 3D IC (2): MLBSHow to build 3D IC (2): MLBS

Bulk Si

Multi-layers Burried Structure

Bulk Si

ILD 1

ILD 2

ILD 3

active device layer 1

active device layer 2

active device layer 3

metal 1ILD 4metal 2ILD 5metal 3

Multi-layers Burried Structure

© PSU28现代VLSI设计技术 Lecture 04, 谢源,2006/8

Who are the Players in this field?Who are the Players in this field?

Institues, Consortia:ASET JapanFraunhofer GermanyIMEC BelgiumRTI USA

Companies:InfineonTezzaronZiptronixZyCubeIBMIntelMicronToshiba

Universities:ArkansasAlbany NanocenterCornellCMULincoln LabsMITNCSURPIGatechPennState

Most of their work on 3D IC are mainly on manufacture, layout tools. Very few architectural level research on 3D IC

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Fabrication Technology for 3D Fabrication Technology for 3D InterconnectionInterconnection

Candidate Technologies

Face-to-back25~60N/ATransfer & joiningIBM

Face-to-face< 5~ 10SOI thin film transferNEU

Face-to-face or face-to-

back~ 303 × 3Cu wafer bonding

RPI/U. Albany

Face-to-back< 53 × 3Cu wafer bondingMIT

Face-to-face or face-to-

back~ 353 × 3Buried-contact +

wafer bondingTohoku Univ.

Stacking Style

Inter-chip Contact Vertical Height

(µm)

Inter-chip Contact

Footprint ( µm2 )TechnologyGroup

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IBMIBM’’s 3D IC: layer transfer s 3D IC: layer transfer

statestate--ofof--thethe--art 130 nm art 130 nm SOI CMOS technology SOI CMOS technology can withstand wafercan withstand wafer--level layer transfer level layer transfer processes.processes.

[[K K GuariniGuarini et al., IEDM 2002]et al., IEDM 2002]

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3D Integration Strategy3D Integration Strategy

3D stacking of IC chipsSystem partitioning

Performance, cost, heat, re-usability, …Chips are separately manufactured and optimizedInter-die communication through “inter-chip contact”

Possible 3D system

Cache

PassiveAnalog

Embedded µP EPROM

Inter-chip contact

Bottom chip: high-performance logic

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SiPSiP vs. True 3D ICvs. True 3D IC

© PSU

SiPSiP

© PSU

SiPSiP

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WhatWhat’’s different for 3D ICs?s different for 3D ICs?Placement

Multiple active layersVertical interconnect weightingInter-wafer vias take up active area space

Leave space between rowsTrade off between via and transistor densities

RoutingInter-wafer routing, through-chip routing channels3D feedthroughs cause congestion

Standard Cell Library/3D IP library3D cells needed with vertical terminals and feedthroughs

Thermal IssuesMore pronounced in 3D ICs

Higher power densitiesInsulating layers between active layers

© PSU39现代VLSI设计技术 Lecture 04, 谢源,2006/8

Design Technology for 3D Design Technology for 3D IntegrationIntegration

Strategic design framework for 3D system3D-aware layout synthesis tools

Embedding the input netlist into a stacked spaceHierarchical assignment of inter-chip contacts

3D-aware analysis and planningSystem partitioningPower distribution planningThermal management

© PSU40现代VLSI设计技术 Lecture 04, 谢源,2006/8

Pros and Cons of 3D IntegrationPros and Cons of 3D Integration

ProsSmaller system footprint

Systematic wirelength reductionBetter chip yield

Optimum technology mixHigher performance at lower cost

Reuse of pre-designed and fabricated die-level IP

System-on-chip

ConsHeat dissipation?

Cache

PassiveAnalog

Embedded µP EPROM

Cache

PassiveAnalog

Embedded µP EPROM

DRAM

RISC Core

PLL

High Performance

Logic

Random Logic

Cache

Analog/RF

DRAM

RISC Core

PLL

High Performance

Logic

Random Logic

CacheCache

Analog/RF3 D system

or

?

© PSU41现代VLSI设计技术 Lecture 04, 谢源,2006/8

Wire-length

Num

ber

of In

ter c

onne

cts (Log-Log Plot) 2-D IC

3-D IC

Wire-length

Num

ber o

f Int

erco

nnec

ts

Study by A. Rahman, PolyTechnic University

Benefits of 3D IC: shorter wiresBenefits of 3D IC: shorter wires

3D IC: Improve density, reduce delay, 3D IC: Improve density, reduce delay, better noise immunity and lower powerbetter noise immunity and lower power

© PSU42现代VLSI设计技术 Lecture 04, 谢源,2006/8

Performance Improvement of 3D ICsPerformance Improvement of 3D ICs

Reduced WirelengthTotal Wirelength

28% for 2 layers, 51% for 5 layers [Das et al., ISVLSI, 2003]Longest Wirelength

31% for 2 layers, 56% for 5 layers [Das et al., ISVLSI, 2003]More Layers Produce More ImprovementLarger Circuit Sizes Produce More Improvement

[Obenaus and Szymanski, TODAES, July 2003]Higher Transistor Packing DensitiesSmaller Chip AreaLower Power per TransistorDecreased Interconnect Delay

© PSU43现代VLSI设计技术 Lecture 04, 谢源,2006/8

Memory WallMemory WallRatio of memory access time to process cycle time increases. System performance limited by memory bandwidth

3D IC can bring memory closer to processor to improve memory access time

MemoryLogic

LogicMemory

uPuPuPuPcorecore

cachecache cachecache

uPuPcorecore

todaytoday futurefuture

© PSU45现代VLSI设计技术 Lecture 04, 谢源,2006/8

3D IC Enables Heterogeneous Integration3D IC Enables Heterogeneous Integration

Integrate different materials, devices, and signals

Hybrid photonic/electronic circuitsStack memory and logic circuitsDigital and analog/RF circuits

Digital / MEMSAnalog / Optical

© PSU46现代VLSI设计技术 Lecture 04, 谢源,2006/8

Fabrication Cost AnalysisFabrication Cost Analysis

Cost modeling for Vector IRAM media processorGSRC cost model by Dr. P. K. Nag

DRAMDRAM

DRAMDRAM

Crossbar & Crossbar & vector logicvector logicIO, CPU,IO, CPU,

& cache& cache

Monolithic implementation~150M transistors290 mm2 die area14 MB embedded DRAM$64 per chip

3D implementationTwo chips: DRAM and logic$45

DRAM chipDRAM chip

Logic chipLogic chip

© PSU

Panel Discussion:Panel Discussion:Temperature: A showstopper for 3D Temperature: A showstopper for 3D

Architecture?Architecture?

Yuan XieThe Pennsylvania State University

Department of Computer Science & [email protected]

The 3rd Temperature-Aware Computer Systems Workshop (TACS), 2006

© PSU48现代VLSI设计技术 Lecture 04, 谢源,2006/8

Key EDA Challenges to Enable 3D Architecture Under the TemperatuKey EDA Challenges to Enable 3D Architecture Under the Temperature re ConstraintsConstraints

Tools for Early Analysis

To estimate temperature (e.g. HS3D, HotSpot)

To study the tradeoff: performance vs. power vs. temperature (e.g. 3DCacti @ ICCD 2005)

-- How many layers? -- Power reduction benefits from 3D may help

mitigate thermal issues(e.g. Intel @ ICCD 2005)

© PSU49现代VLSI设计技术 Lecture 04, 谢源,2006/8

Key EDA Challenges to Enable 3D Architecture Under the TemperatuKey EDA Challenges to Enable 3D Architecture Under the Temperature re ConstraintsConstraints

Tools for Physical Design

3D Physical Design tools must be thermal-aware Vertical optimizationHorizontal optimization

(e.g. 3D FP @ ISQED 2006)

Thermal Via planning (similar to the elevator in high-rise) (e.g. GIT/UMN/UCLA research)