Comprehensive Testing of Harmonic Filters

2014 Doble Engineering Company 81ST International Conference of Doble Clients All Rights Reserved

N1 N2

184.2uF

864

7.675uF

864 38.2mH

N1 N2

138.7uF

5.0810.85mH

COMPREHENSIVE TESTING OF HARMONIC FILTERS

Long Pong Doble Engineering Company

Francis Thibault Rio Tinto - Alcan

Dennis M Boyd Nucor Steel Berkeley

ABSTRACT Harmonic filters and capacitor banks were once considered as a secondary apparatus in a substation, and received very little attention as far as testing or condition monitoring. Due to a great augmentation of electronic loads in recent decades, these apparatus play an important role in stabilizing the network, improving the power quality and increasing the capacity of transmitting electricity. For energy intensive industrial customers such as aluminum or steel makers, their production can be idled if their filter or static var systems are out of service. Therefore a run-to-failure program becomes a more costly option and, as a result, the electrical utility is now interested in rigorous quality control and preventive maintenance programs. To this end, this paper will provide the test techniques available that provide valuable information of the harmonic filter condition. Three harmonic filters described in Figure 1 and Table 1 are used as the case study and subjected to the SFRA (Sweep Frequency Response Analyzer), capacitor bank, and inductor and resistor tests. The first two filters are new and tested during commissioning to check the design parameters, to control quality of assembly and to establish the baseline for the future maintenance program or troubleshooting. The third filter is 2007 vintage and is used as for experiment to study if the SFRA test is effective in detecting a capacitor failure in the bank, and to check the overall system condition and frequency characteristics. Key Words: Harmonic Filter, Capacitor Bank, Condition Assessment, Resonant Frequency, Q factor, Inductance, Capacitance, Resistance, Field Testing. a) F1: 5th Harmonic Filter b) F2: 11.3th Harmonic Filter c) F3: 13th Harmonic Filter

Per Phase Circuit of Harmonic Filters

Figure 1

N1 N2

88.5uF

0.473mH


2 of 19

Resistor Inductor Capacitor

Table 1

Harmonic Filter Description Filter 1 (F1) Filter 2 (F2) Filter 3 (F3)

Manufacturer Alstom Alstom Cooper Type C Damped -

MVAR 75 50 40 kV 161 161 34.5

Configuration Y-Y floating Y-Y floating Y-Y floating Tuning Frequency (Hz) 300Hz (5th) 678 (11.3th) 780 (13th)

a) 161kV Filter b) 34.5kV Filter

Typical Installation of Harmonic Filters Figure 2

DESCRIPTION OF HARMONIC FILTERS In addition to harmonics filtering, the filter bank provides reactive power and requires various levels of electrical damping to control the voltage oscillation during transient or in harmonic presence. Normally, it has its natural damping is governed by the resistive component of the inductive impedance. If the natural damping is not sufficient, then damping by other means must be provided. A measure of the ratio between the reactive power and active power in the reactor represents the quality factor or Q factor (X/R), and is also the measure of the damping. A lower Q factor indicates higher damping. The typical natural Q factors of filter reactors are between 50 and 200 [1], which is too high for most power electronic systems such as rectifiers or arc furnaces. Various methods to provide higher damping are described in the following filter banks, and summarized in Table 2. 1. Rio Tinto Alcan: The two harmonic filters are the high-pass damped type.

The F1 filter is tuned at the fifth (5th) harmonic of the system frequency (60Hz) and called the C type design. This design provides lower losses in the resistor, because at the system frequency the resistor is shorted out by the serial resonance of L5 and C5, as shown in Figure 3a. But at a higher frequency spectrum, the resistor will provide the necessary damping. The capacitor bank configuration is an internally fused ungrounded double wye circuit shown in Figure 3a which consists of two parallel branches. Each branch has sixteen serial pairs of capacitors as shown in Figure 3b.

Inductor Capacitor

De-Q Rings


3 of 19

N1 N2

C5

R5

C5

R5 L5

L11

N1 N2

C11

R11

Simple-String Double-String

a) Phase Circuit b) Double-String of Capacitor

F1 (5th Harmonic) Filter Electrical Schematic Figure 3

The F2 filter is tuned at the 11.3th harmonic and is 2nd order high-pass type that provides damping over a large spectrum of harmonics. This filter performs better than the F1 filter (C-type), but has higher resistive losses. The capacitor bank configuration is an internally fused ungrounded double wye circuit as shown in Figure 4a, which consists of two parallel groups. One group is a simple string of thirteen serial capacitors (Figure 4a) and the other group is double-string and has thirteen serial pairs of capacitors as shown in Figure 3c.

a) Simple String of Capacitor b) Phase Circuit c) Double-String of Capacitor

F2 (11th Harmonic) Filter Electrical Schematic Figure 4

2. Nucor Steel Berkeley: F3 filter is tuned at the 13th harmonic and has no actual resistor in the circuit, instead uses two De-Q rings that play the role of a resistor connected in parallel with the reactor, Figure 5b. This can reduce the Q factor as much as 10 times. Therefore, this filter has a similar damping characteristic as the 2nd order high-pass damped filter or the previous F2 filter, and its advantage is more compact installation. The capacitor bank configuration is an externally fused ungrounded double wye circuit as shown in Figure 5a, which consists of two parallel branches. Each branch has two serial groups and each group has eight parallel capacitors as shown in Figure 5c.

Z60Hz = 0

C5

C5

N2

R5

L5

N2

L11/R11

N2

L11/R11


4 of 19

N2

b) Equivalent De-Q Ring Circuit Under Loading

a) Phase Circuit c) Capacitor Branch

F3 (13th Harmonic) Filter Electrical Schematic

Figure 5 The De-Q rings of the filter comprises two coaxially arranged closed steel rings systems, one

mounted on the top and the other mounted at the bottom of the reactor as shown in Figures 2b and 5a. This arrangement couples the magnetic flux of the reactor to the closed rings and will induce the circulating currents in the rings. This results in a small flux counter reaction in a similar way as in secondary loaded windings of a transformer, and a small decrease in overall inductance. Therefore this filter has slightly variable inductance due to the self-inductance and mutual inductance of the De-Q rings.

TEST PROCEDURE AND DATA SIGNIFICANCE Test Procedure The test principle is to measure the three main components (Capacitor, Inductor and Resistor) of the harmonic filter and the frequency characteristics of the system. Table 2 summarizes the test methods and instruments used in the field.

Table 2 Harmonic Filter Description

Filter Component Test Method: Requirement Test Procedure Measured Parameter Purpose

Capacitor unit (C) CapBank:M4100, M4110 & M4140 Figure 6a Capacitance & Power Factor

Assess condition and nominal value

Inductor (L) Reactance:M4100 &M4110 Figure 6b Inductance & Resistance

Assess condition and nominal value

Resistor (R) Ohmmeter: Handheld or M4100 & M4110

Figure 6b Resistance Assess condition and nominal value

System (RLC) SFRA: M5400 Figure 6c Resonance Frequency and Resistance

Check design parameters: Fn and Q

The test procedure of individual components and filters are described in Figures 6. For capacitor testing, a detailed test procedure can be found in previous papers [2]. For the inductor test, the test procedure is the same as the standard Leakage Reactance Test (LRT) [3]. For the SFRA test, the filter has to be isolated from ground and two tests are required if the Q factor improvement is needed to be determined. One test is with the resistor or De-Q rings and another test is without resistor or De-Q rings.

N1

L13

C13

L13 R13 (Induced)

N2

L13


5 of 19

a) Individual Capacitor Testing b) Individual Inductor or Resistor Testing c) SFRA Testing

per phase

Test Connection of Filter Components Figure 6

Data Interpretation Inductor or Resistor Inductors and resistors should test within 2% of the nameplate inductance and resistance value respectively. The measured reactance and resistance can be used to calculate the natural Q60 factor at the test frequency (60 Hz) and the measured inductance can be used to calculate the QR factor at the resonant frequency. Individual Capacitor The details of data analysis can be found in [2 and 4] and are summarized in Table 3. Typically, a good capacitor unit will test within 3% of the nameplate value and the power factor should be 3% or lower.

Table 3 Limit of %PF and the capacitance variation of single capacitor unit

Condition Normal Higher than Normal Very High Limit Within 3% Between 3% and 5% 5% Typical Problem

Normal condition

Internal deterioration or bad mounting/ connection

Internal damage

Action None Inspecting and monitoring Replacing the bad unit

Frequency Response Analysis The SFRA test will provide the frequency characteristics of the filter impedance in graphic and tabulation data, which should be used to confirm the design parameters: the resonant or tuning frequency and the Q factor. The resonant frequency (FR) can be read directly from the graphic and the Q factor at the resonant frequency can be obtained by the calculation X/R at the resonant frequency. These two values FR and Q should compare with the design values. Presently, no analysis criteria have been established, however a deviation between the measured and design parameter should not exceed 2%. This limit is based on individual component tolerance.

A change in the resonant frequency will indicate a change in the reactance value, either in the capacitance or inductance; therefore we want to use this feature as a means to detect a capacitor failure in the filter, see the finding in the following section Test Data and Analysis. TEST DATA AND ANALYSIS The detail of test results are in Appendix and summarized in the following section.

M4100

M4110


6 of 19

Capacitors: The test results shown in Figures 7, 8 and 9 are all within the acceptable limit and compared well among the units; the deviation from the nameplate capacitance was well below 3% and the power factors were below 3%.

F1 Filter: Individual Capacitors Figure 7

0.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

4.5

5.0

18

19

20

21

22

23

%PF

Cap

(uF)

Cap ID

Cap %PF

F2 Filter: Individual Capacitors Figure 7

C5

C5


7 of 19

F3 Filter: Individual Capacitors of Phase B Figure 8

Inductor: The test results are summarized in Table 4 with the following observations. 1. In F1 and F2 filters, the maximum deviation between the measured and nameplate inductance was

0.52% which is well below the acceptable limit (2%). 2. In F3 filter, the measured inductance has a greater discrepancy, 16-18% deviation was obtained

which requires an investigation and more explanations are provided in the section SFRA. A possible cause of this discrepancy is the De-Q ring influence.

3. The natural factors Q of each inductor at 60 Hz were obtained in the range between 41 and 96, which are the value predicted in the previous section of Filter Description.

4. The lowest Q values are in the F3 inductor. This is due to the effect of the De-Q rings included in the measurement.

Table 4

Inductor Test Results Filter Ph. A V mH %H R () Z () X () Q60Hz

F1 (L5) A 5.57 80.37 38.2 0.00% 0.15 14.42 14.42 96 B 5.58 80.48 38.2 0.00% 0.157 14.42 14.42 92 C 5.60 80.34 38.0 -0.52% 0.178 14.33 14.33 81

F2 (L11) A 19.45 80.09 10.9 0.46% 0.074 4.12 4.12 56 B 19.59 80.01 10.8 -0.46% 0.075 4.08 4.08 54 C 19.72 80.25 10.8 -0.46% 0.073 4.07 4.07 56

F3 (L13) A 12.44 2.57 0.549 16% 0.005 0.207 0.207 41 B 12.43 2.577 0.549 16% 0.005 0.207 0.207 41 C 12.25 2.569 0.557 18% 0.004 0.21 0.21 53

Resistor: No field test was performed. SFRA - Frequency Characteristics: The SFRA test results are in Appendix 2 and summarized in Table 5 with the following observations.

F1 and F2 filter observations, see Figures 10 and 11: 1. Test results were very consistent among phases and matched the design parameters; 2. Maximum deviation between the measured and design resonant frequencies is 0.1%; 3. Resistor has a great effect on the Q factor, which has decreased in order of 20 and 30 times. F3 Filter observations, see Figures 12 to 15: 1. Effect of removing one capacitor was noticeable, the frequency had shifted from 723Hz to 739Hz

which is about 2.2%, more than what was predicted (1.71%), See Figure 13. The difference could be due to the sweeping interval of the test frequency.

2. Test results were very consistent among phases, but the measured resonant frequency did not match the design resonant frequency. Phase C has the largest difference of -7.3% and the resonance occurs closer to 12th harmonic than 13th harmonic, See Figure 12.

3. Removing the De-Q rings has the effect of decreasing the resonant frequency see Figure 14, or in other words, made the equivalent inductance increase. This confirms that the De-Q rings produce the counter-emf on the inductor, reduce the equivalent inductance or increase the resonant frequency. The higher the current, the greater the counter-emf, and the more shifting of the resonant frequency toward 13th harmonic. Therefore, at the rated current, the resonant frequency should be at 13th harmonic.


8 of 19

4. De-Q rings seemed to have no effect on the Q factor. This might be due to the test current being too low and producing no significant watt loss or resistive component, see Figure 14.

5. Shorting the neutral CT had three effects on the frequency responses, see Figure 15: a) increasing the main resonant frequency from 730Hz to 764Hz (4.7%); b) deepening the valley of the main resonance or increase the Q factor and c) eliminating the minor double resonances around 1.5 kHz.

Table 5

Frequency Characteristics Obtained by SFRA Tests

Test Condition Ref. Freq.

(Hz) Freq. (Hz)

Freq. %Dev R () Q

F1 As is 300 300 0% 7.3 9.8 Without R 300 0% 0.36 198

F2 As is 678 677 -0.1% 9.31 4.9 Without R 677 -0.1% 0.3 153

F3-Phase A

As is-Phase A 780 723 -7.3% 0.06 42 1 Cap removed 793 739 -6.8% 0.09 28

%Dev-1C 1.7% 2.2%

F3-Phase C

As is-Phase C 780 730 -6.4% 0.05 51 Without DQ Ring 699 -10.4% 0.04 61

Shorted CT 730 764 4.7% 0.02 134

F1 Filter (5th Harmonic) SFRA Traces F2 Filter (11th Harmonic) SFRA Traces Figure 10 Figure 11

a) Overall View b) Zoom in in View

With Resistor

Without R i t

Measured Frequency: 300 HZ

With Resistor

WithoutR i t




9 of 19

F3 Filter (13th Harmonic) SFRA Traces Figure 9

a) Overall View b) Zoom in in View

F3 Filter SFRA Traces with and without One Fuse Removed Figure 10

a) Overall View b) Zoom in in View F3 Filter SFRA Traces with and without De-Q Rings

Figure 11

a) Overall View b) Zoom in in View F3 Filter SFRA Traces with and without Shorted CT

Figure 15

(No cap removed) 723 Hz (With one cap removed)

739 Hz

Minor Resonances

(With CT) 730 Hz

(With Shorted CT) 764 Hz

(With D-Q Rings)730 Hz

(Without D-Q Rings) 699 Hz


10 of 19

CONCLUSION AND DISCUSSION These field tests have clearly demonstrated the effectiveness and usefulness of the three field test techniques: Capacitor testing with the Doble CapBank tool, Reactor testing using Leakage Reactance and SFRA tests. These tests can provide the information on the individual component condition and the system frequency characteristics. The test requirement is a minimum for the user of M series test equipment; the test procedure and interpretation are simple and can be easily implemented in a commissioning, maintenance program or used for troubleshooting.

Also we have learned the following points from the field testing:

1. Comprehensive impedance data (R, X, L, C, Z and %PF) of each individual component can be easily obtained;

2. System design parameters or study simulation can be verified and the quality control of the component selection and assembly can be done just before energizing;

3. SFRA can be used to detect capacitor failure with the following cautions: a) the sensitivity of the detection will decrease with the increase of capacitor number in the bank. b) Simultaneous change of multiple components can neutralize the frequency response shifting and the effectiveness of the detection.

4. Frequency characteristics of a filter equipped with De-Q rings installed on the reactor as a damping factor could not be obtained accurately with these field test techniques, because the test current is too low, unable to induce the full counter-emf effect of the De-Q rings. The authors suggest more study such as performing a test at rated current. However the SFRA traces are still useful as baseline for future test performed in the same condition.

5. Data baseline and signatures can be established for future needs such as preventive maintenance, diagnostic or replacement program;

6. Disconnection of the individual capacitor unit from the bank is not required which in turn significantly reduces test time. Each test takes about 35 seconds to run.

7. DTA Pro software is recommended for testing the individual capacitor, because it has the Capacitor Bank test plan including the data graphic and analysis.

8. The individual capacitor test can take more time and yields comprehensive information while SFRA test is less time consuming and yields more of an overall result. It is hoped that the SFRA test can be done more often than the individual capacitor test, and then lead us to perform the more comprehensive individual capacitor test should the SFRA test show a significant frequency shift. The individual capacitor tests are still recommended on a higher period since it is much more sensitive to the capacitor ground losses.

FUTURE CONSIDERATIONS

1. SFRA testing on filters should be performed with the neutral CT shorted out, either on the secondary or the primary winding;

2. SFRA software should have the test frequency steps adjustable around the main resonant frequency of the filter. This will increase the trace resolution in this area and to improve the accuracy of detecting a smaller change in a reactance.

3. Incorporate Leakage Reactance Test (LRT) plan into either Reactor or Capacitor Bank test plan. This will allow testing the inductance of the reactor.


11 of 19

REFERENCES [1] R. F. Dudley, The Use of De-Q-Rings for Quality Factor (Q-Factor) Reduction, Trench Electric, Document No TF-93.019 [2] Long Pong and Daryl Wheat, Update - Field Testing Capacitor Bank With M4000 Test Instrument, Minutes of the 74th Annual International Conference of Doble Clients, 2007, in Arresters, Capacitors, Cables and Accessories Committee, paper ACCA 3 [3] Doble Engineering Company, Doble Test Procedures - Leakage Reactance Testing, Document No 72A-2244-01 Rev. C 4/09, Chapter 5, Page 5-73 [4] Doble Engineering Company, Application Notes M4140, Document #500-0688 / 72A-2703-01 REV A BIOGRAPHY

Long Pong has been employed at Doble Engineering since 2000, and currently works as a Senior Principal Engineer in the Client Service Department. He has amassed over 25 years of experiences in condition assessment, electrical testing/repair and project management of Generation, Transmission and Distribution apparatuses. Mr. Pong has published numerous technical papers pertaining to condition assessment, troubleshooting and new test techniques of power electrical apparatus. Before joining Doble, he was employed at Alcan-nergie lectrique and Hydro-Quebec. He is IEEE member and a registered professional engineer in North Carolina. He obtained his

Bachelor of Electrical Engineering from cole Polytechnique de Montreal, Quebec, Canada, in 1988.

Francis Thibault, Jr. Eng., obtained his Bachelor of Electrical Engineering from University of Qubec in Chicoutimi, Canada, in 2012. Francis has worked for Rio Tinto Alcan- nergie lectrique since 2012 and is responsible for providing the technical support to the maintenance of the power distribution network of RTAs industrial complex in Jonquire.

Dennis M Boyd graduated from Rensselaer Polytechnic Institute in 1977 with a BSEE. Dennis has 36 years of experiences in the Maintenance and Engineering fields in steel making facilities with more extensive emphasis in Melt Shop and Power Distribution at Nucor Steel Berkeley. Dennis has co-authored papers on voltage flicker and protective relay application.


12 of 19

APPENDIX 1 Field Test Results of Individual Component

Table 6

F1 Filter: Doble CapBank Test Data of Individual Capacitor # ID %PF Cap (uF) ID %PF Cap (uF) ID %PF Cap (uF)

1 A1O-1 0.47 29.28 B1O-1 0.42 29.13 C1O-1 0.48 29.06 2 A1O-2 0.47 29.14 B1O-2 0.42 29.27 C1O-2 0.49 29.40 3 A1O-3 0.46 29.24 B1O-3 0.42 29.33 C1O-3 0.48 29.22 4 A1O-4 0.45 29.19 B1O-4 0.42 29.06 C1O-4 0.51 29.23 5 A1O-5 0.43 29.26 B1O-5 0.97 29.21 C1O-5 1.01 29.30 6 A1O-6 0.44 29.24 B1O-6 0.97 29.21 C1O-6 1.03 29.14 7 A1O-7 0.44 29.18 B1O-7 0.43 29.30 C1O-7 0.46 29.34 8 A1O-8 0.45 29.23 B1O-8 0.45 29.09 C1O-8 0.48 29.16 9 A2O-1 0.44 29.18 B2O-1 0.45 29.40 C2O-1 0.49 29.27

10 A2O-2 0.43 29.26 B2O-2 0.46 29.10 C2O-2 1.04 29.09 11 A2O-3 0.45 29.12 B2O-3 0.43 29.10 C2O-3 0.47 29.41 12 A2O-4 0.46 29.27 B2O-4 0.43 29.18 C2O-4 0.48 29.12 13 A2O-5 0.46 29.41 B2O-5 0.42 29.17 C2O-5 1.05 29.12 14 A2O-6 0.44 29.00 B2O-6 0.41 29.25 C2O-6 0.47 29.55 15 A2O-7 0.48 29.50 B2O-7 0.41 29.26 C2O-7 0.46 29.15 16 A2O-8 0.44 28.89 B2O-8 0.43 29.14 C2O-8 0.49 29.27 17 A3O-1 0.44 29.17 B3O-1 0.41 29.29 C3O-1 0.45 29.28 18 A3O-2 0.44 29.12 B3O-2 0.44 29.09 C3O-2 0.46 29.27 19 A3O-3 0.44 29.55 B3O-3 0.42 29.19 C3O-3 0.45 29.37 20 A3O-4 0.45 29.11 B3O-4 0.40 29.16 C3O-4 0.47 29.01 21 A3O-5 0.46 29.12 B3O-5 0.42 29.21 C3O-5 0.49 29.65 22 A3O-6 0.46 29.33 B3O-6 0.42 29.16 C3O-6 0.49 29.04 23 A3O-7 0.44 29.11 B3O-7 0.44 29.14 C3O-7 0.46 29.35 24 A3O-8 0.45 29.16 B3O-8 0.52 29.15 C3O-8 1.03 29.13 25 A4O-1 0.41 28.82 B4O-1 0.44 29.30 C4O-1 1.08 28.96 26 A4O-2 0.48 29.53 B4O-2 0.46 29.32 C4O-2 1.06 28.98 27 A4O-3 0.42 28.78 B4O-3 0.44 29.25 C4O-3 1.06 29.70 28 A4O-4 0.44 29.60 B4O-4 0.45 28.94 C4O-4 1.03 29.27 29 A4O-5 0.44 29.15 B4O-5 0.44 29.39 C4O-5 1.06 29.19 30 A4O-6 0.44 29.27 B4O-6 0.41 28.96 C4O-6 1.05 29.20 31 A4O-7 0.43 46.88 B4O-7 0.43 47.39 C4O-7 0.46 47.08 32 A4O-8 0.43 47.23 B4O-8 0.42 46.64 C4O-8 0.45 47.22 33 A1E-1 0.42 29.08 B1E-1 0.41 29.19 C1E-1 0.98 29.17 34 A1E-2 0.43 29.37 B1E-2 0.45 29.24 C1E-2 1.01 29.28 35 A1E-3 0.45 29.04 B1E-3 0.42 29.19 C1E-3 0.49 29.25 36 A1E-4 0.45 29.38 B1E-4 0.44 29.22 C1E-4 0.49 29.26 37 A1E-5 1.01 29.20 B1E-5 0.44 29.14 C1E-5 0.49 29.17 38 A1E-6 0.46 29.23 B1E-6 0.43 29.24 C1E-6 0.51 29.29 39 A1E-7 0.47 29.17 B1E-7 0.43 29.24 C1E-7 0.51 29.38 40 A1E-8 0.48 29.24 B1E-8 0.44 29.15 C1E-8 0.51 29.11 41 A2E-1 0.46 29.22 B2E-1 0.44 28.81 C2E-1 0.50 29.21


13 of 19

42 A2E-2 0.45 29.46 B2E-2 0.43 29.60 C2E-2 0.50 29.21 43 A2E-3 0.44 29.42 B2E-3 0.43 28.91 C2E-3 1.02 29.13 44 A2E-4 0.43 28.75 B2E-4 0.43 29.42 C2E-4 0.52 29.33 45 A2E-5 0.44 28.97 B2E-5 0.45 29.17 C2E-5 0.52 29.10 46 A2E-6 0.44 29.45 B2E-6 0.44 29.20 C2E-6 0.52 29.32 47 A2E-7 0.43 29.10 B2E-7 0.39 29.26 C2E-7 0.47 29.21 48 A2E-8 0.44 29.36 B2E-8 0.43 29.13 C2E-8 0.49 29.27 49 A3E-1 0.38 29.22 B3E-1 0.44 29.19 C3E-1 0.49 29.37 50 A3E-2 0.41 29.08 B3E-2 0.43 29.12 C3E-2 0.51 29.12 51 A3E-3 0.38 29.49 B3E-3 0.43 29.39 C3E-3 0.51 29.23 52 A3E-4 0.42 29.07 B3E-4 0.43 29.08 C3E-4 0.51 29.24 53 A3E-5 0.39 29.09 B3E-5 0.41 29.31 C3E-5 1.07 29.04 54 A3E-6 0.40 29.35 B3E-6 0.43 29.11 C3E-6 0.52 29.68 55 A3E-7 0.43 29.05 B3E-7 0.44 29.25 C3E-7 0.52 29.01 56 A3E-8 0.36 29.20 B3E-8 0.42 29.13 C3E-8 0.53 29.25 57 A4E-1 0.40 47.01 B4E-1 0.42 46.83 C4E-1 0.48 47.11 58 A4E-2 0.41 47.00 B4E-2 0.41 47.22 C4E-2 0.48 47.43 59 A4E-3 0.38 29.10 B4E-3 0.48 29.54 C4E-3 1.08 29.06 60 A4E-4 0.40 29.29 B4E-4 0.41 28.86 C4E-4 1.09 29.12 61 A4E-5 0.43 29.07 B4E-5 0.43 29.07 C4E-5 1.10 29.10 62 A4E-6 0.41 29.30 B4E-6 0.44 29.30 C4E-6 1.08 28.98 63 A4E-7 0.41 29.16 B4E-7 0.44 29.09 C4E-7 1.11 29.10 64 A4E-8 0.37 29.23 B4E-8 0.41 29.49 C4E-8 0.51 29.18

Table 7 F2 Filter: Doble CapBank Test Data of Individual Capacitor

# ID %PF Cap (uF) ID %PF Cap (uF) ID %PF Cap (uF) 1 A1O-1 0.47 22.55 B1O-1 1.03 22.52 C1O-1 0.48 22.50 2 A1O-2 0.45 22.53 B1O-2 1.07 22.51 C1O-2 0.48 22.54 3 A1O-3 1.00 22.31 B1O-3 1.00 22.55 C1O-3 0.97 22.44 4 A1O-4 1.02 22.65 B1O-4 1.00 22.48 C1O-4 1.00 22.56 5 A1O-5 1.04 22.43 B1O-5 1.06 22.57 C1O-5 1.04 22.40 6 A1O-6 1.06 22.50 B1O-6 0.41 22.34 C1O-6 1.03 22.58 7 A1O-7 0.99 22.43 B1O-7 0.38 22.52 C1O-7 1.03 22.41 8 A1O-8 1.02 22.49 B1O-8 1.06 22.55 C1O-8 0.43 22.58 9 A2O-1 1.00 22.56 B2O-1 1.03 22.32 C2O-1 1.00 22.49 10 A2O-2 1.01 22.44 B2O-2 0.39 22.60 C2O-2 1.04 22.58 11 A2O-3 1.01 22.48 B2O-3 0.39 22.37 C2O-3 1.06 22.49 12 A2O-4 1.02 22.44 B2O-4 1.08 22.60 C2O-4 1.05 22.52 13 A2O-5 1.03 22.67 B2O-5 1.01 22.31 C2O-5 1.00 22.49 14 A2O-6 1.03 22.33 B2O-6 1.04 22.67 C2O-6 0.43 22.58 15 A2O-7 1.01 22.54 B2O-7 1.04 22.41 C2O-7 0.42 22.50 16 A2O-8 1.01 22.42 B2O-8 0.41 22.59 C2O-8 1.02 22.58 17 A3O-1 1.07 22.33 B3O-1 1.06 22.39 C3O-1 1.04 22.38 18 A3O-2 1.05 22.50 B3O-2 0.42 22.59 C3O-2 1.05 22.54 19 A3O-3 1.03 22.20 B3O-3 1.05 22.34 C3O-3 0.38 22.36


14 of 19

20 A3O-4 1.02 22.61 B3O-4 1.05 22.30 C3O-4 0.41 22.50 21 A3O-5 1.02 22.38 B3O-5 1.06 22.21 C3O-5 1.00 22.40 22 A3O-6 1.06 22.39 B3O-6 1.04 22.58 C3O-6 1.06 22.49 23 A3O-7 1.06 22.37 B3O-7 1.02 22.57 C3O-7 1.00 22.59 24 A3O-8 0.39 22.48 B3O-8 1.02 22.40 C3O-8 1.02 22.45 25 A4O-7 1.04 22.58 B4O-7 0.39 22.55 C4O-7 1.05 22.56 26 A4O-8 0.40 22.22 B4O-8 1.02 22.38 C4O-8 1.03 22.33 27 A1E-1 0.43 22.45 B1E-1 0.41 22.55 C1E-1 0.44 22.42 28 A1E-3 0.43 22.41 B1E-3 0.40 22.31 C1E-3 0.43 22.58 29 A1E-5 0.43 22.46 B1E-5 0.41 22.55 C1E-5 0.45 22.41 30 A1E-7 0.46 22.46 B1E-7 0.42 22.55 C1E-7 0.47 22.59 31 A2E-1 0.45 22.39 B2E-1 0.42 22.57 C2E-1 0.42 22.46 32 A2E-3 0.42 22.54 B2E-3 0.39 22.37 C2E-3 0.44 22.56 33 A2E-5 0.43 22.38 B2E-5 0.42 22.62 C2E-5 0.43 22.48 34 A2E-7 0.44 22.52 B2E-7 0.41 22.35 C2E-7 0.41 22.53 35 A3E-1 0.44 22.43 B3E-1 0.44 22.54 C3E-1 0.42 22.56 36 A3E-3 0.46 22.52 B3E-3 0.42 22.42 C3E-3 0.44 22.27 37 A3E-5 0.38 22.42 B3E-5 0.44 22.41 C3E-5 0.42 22.49 38 A3E-7 0.42 22.22 B3E-7 0.42 22.35 C3E-7 0.43 22.36 39 A4E-1 1.09 22.39 B4E-1 0.45 22.45 C4E-1 0.43 22.46

Table 8

F3 Filter-Phase B: Doble CapBank Test Data of Individual Capacitor # ID %PF Cap (uF) # ID %PF Cap (uF)

1 B1-1-1 1.08 11.03 17 B2-1-1 1.11 11.02 2 B1-1-2 1.10 11.00 18 B2-1-2 1.13 11.00 3 B1-1-3 1.13 10.96 19 B2-1-3 1.10 11.03 4 B1-1-4 1.09 11.04 20 B2-1-4 1.11 11.09 5 B1-1-5 1.10 11.02 21 B2-1-5 1.15 10.97 6 B1-1-6 1.08 11.02 22 B2-1-6 1.12 10.91 7 B1-1-7 1.09 10.97 23 B2-1-7 1.12 10.92 8 B1-1-8 1.12 10.98 24 B2-1-8 1.14 10.96 9 B1-2-1 1.13 10.92 25 B2-2-1 1.13 11.00

10 B1-2-2 1.14 11.00 26 B2-2-2 1.14 11.03 11 B1-2-3 1.13 11.00 27 B2-2-3 1.14 11.03 12 B1-2-4 1.12 10.87 28 B2-2-4 1.15 11.01 13 B1-2-5 1.13 11.05 29 B2-2-5 1.18 11.02 14 B1-2-6 1.25 11.08 30 B2-2-6 1.19 10.97 15 B1-2-7 1.24 11.08 31 B2-2-7 1.16 11.01 16 B1-2-8 1.16 10.93 32 B2-2-8 1.16 10.99


15 of 19

Table 9 Test Data of Individual Inductor

Filter Phase A V W %PF mH R () Z () X ()

F1 L5-A 5.573 80.37 4.65 1.04 38.2 0.15 14.417 14.416 L5-B 5.579 80.48 4.90 1.09 38.2 0.157 14.416 14.415 L5-C 5.603 80.34 5.60 1.24 38.0 0.178 14.334 14.332

F2 L11-A 19.445 80.09 27.89 1.79 10.9 0.074 4.118 4.118 L11-B 19.59 80.01 28.64 1.83 10.8 0.075 4.084 4.083 L11-C 19.716 80.25 28.33 1.79 10.8 0.073 4.072 4.071

F3 L13-A 12.442 2.57 0.77 2.42 0.55 0.005 0.207 0.207 L13-B 12.426 2.58 0.77 2.41 0.55 0.005 0.207 0.207 L13-C 12.247 2.57 0.60 1.91 0.56 0.004 0.210 0.21

Note: The shady fields are calculated from other parameters measured in DTA Pro test plan.


16 of 19

APPENDIX 2 Field Test Results of SFRA

F1 Filter SFRA Traces with Resistors

Figure 16

F1 Filter SFRA Traces without Resistors

Figure 17


17 of 19

F2 Filter SFRA Traces with Resistors

Figure 18

F2 Filter SFRA Traces without Resistors

Figure 19


18 of 19

F3 Filter SFRA Traces

Figure 20

F3 Filter SFRA Traces with and without one capacitor removed

Figure 21

With one capacitor removed


19 of 19

F3 Filter SFRA Traces with and without De-Q Rings

Figure 22

F3 Filter SFRA Traces with and without CT shorted

Figure 23

Without De-Q Ring

With CT Shorted

Comprehensive Testing of Harmonic Filters

Documents

Transcript of Comprehensive Testing of Harmonic Filters